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Webinar Invite: Fast and Accurate High-Sigma Analysis with Worst-Case Points on November 14th

Many thanks for your past interest in our EDA tools and solutions for automated circuit migration, verification, sizing, and optimization of custom Circuit IC and IP. Our next webinar Fast and Accurate High-Sigma Analysis with Worst-Case Points will go live on

Tuesday November 14th 2023,

and I want invite you to join this very interesting new topic.

Advanced semiconductor nanometer technology nodes, together with smart IC design applications enable today very complex and powerful systems for communication, automotive, data transmission, AI, IoT, medical, industry, energy harvesting, and many more. Random variation in the manufacturing process is a challenge for all full custom circuit designers, because their designs must be so insensitive to process variations that a high percentage of manufactured circuits meets their specification. Therefore, all circuit designs must be validated by simulation not only for typical manufacturing conditions, but also under a process model that includes die-to-die and on-chip local variation.

Some designs demand a very high level of robustness such as failure rates below 1 part-per-million, particularly in automotive applications and in memory design. In this webinar we will introduce and explain verification methods beyond brute force Monte Carlo sampling for such high parametric yields. MunEDA’s tool suite WiCkeD provides high-sigma circuit analysis and optimization.

This webinar is presented in partnership with SemiWiki and MunEDA.

Register for this webinar here:

Fast and Accurate High-Sigma Analysis with Worst-Case Points

All registered attendees can view a recording of this webinar also on-demand after November 14th, in case they missed the date.

With best regards,

Andreas Ripp, Vice President Sales & Marketing, MunEDA


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