MUGM 2008

We are pleased to invite you to the MunEDA Users Group Meeting 2008.

MUGM 2008 will take place on October 09^th & 10^th (Thu/Fri), 2008 in Munich, Germany. The goal of the event is an intensive exchange of knowledge by new and experienced industrial users. MUGM provides an open forum for engineers interested in MunEDA solutions for Custom IC Design Migration, Analysis, Modelling and Optimization.

This years focus of the MunEDA User Group Meeting 2008 will be the special topic:

Sizing Strategies for Smart Systems and High-Robust & High-Reliable Circuit Designs

Selection of Presentation Topics at MUGM 2008:

Thursday, 9th October, 2008

10:30 – 11:00	Registration & Welcome Coffee
11:00 – 12:00	Session 1
11:00 – 11:15	MunEDA – Welcome & Whats new A. Ripp, VP Sales & Marketing, MunEDA
11:15 – 12:00	KEYNOTE: Considering parameter variations in IC design optimization: Pareto-front calculation and other ideas U. Schlichtmann, Technical University of Munich
12:00 – 13:00	Lunch Break
13:00 – 14:10	Session 2
13:00 – 13:30	STMicroelectronics: Designflow Integration into UNICAD and selected industrial WiCkeDTM application cases P. Daglio, STMicroelectronics
13:30 – 14:10	WiCkeDTM 6.0 – Software Tutorial M. Pronath, VP Products & Solutions, MunEDA GmbH
14:10 – 14:20	Coffee & Discussion Break
14:20 – 15:50	Session 3
14:20 – 14:50	STMicroelectronics: WiCkeDTM 6.0 Modelling – Industrial application cases E. Raciti, STMicroelectronics
14:50 – 15:20	Infineon: Integration of DFY into Infineon’s Front-end Analog Communication Designflow P. Rotter, Infineon Technologies AG
15:20 – 15:50	Fraunhofer EAS: Sigma65 – Digital Timing and Power Simulation with Statistical Process Variations J. Haase, U. Eichler, Fraunhofer IIS EAS H. Häner, R. Häußler, Infineon Technologies AG
15:50 – 16:10	Coffee & Discussion Break
16:10 – 17:40	Session 4
16:10 – 16:40	ZMD: High Reliable Design for High-Performance Analog Circuits U. Sobe, K.-H. Rooch, ZMD AG
16:40 – 17:10	Using WiCkeDTM for Solving Discrete Optimization Problems in BiCMOS Design V. Boos, IMMS gGmbH / X-FAB B. Dimov, TU Ilmenau / IMMS gGbmH
17:10 – 17:40	STMicroelectronics: Circuit Analysis and Yield Optimization for critical Analog Blocks in Non Volatile Memories Application M. Micciche, STMicroelectronics
17:40 – 18:00	Wrap-up Day 1, Discussion and Directions A. Ripp, VP Sales & Marketing, MunEDA GmbH
From 19:30	Social Event at Vinorant Alter Hof

Friday, 10th October, 2008

10:00 – 11:10	Session 5
10:00 – 10:20	WiCkeD Release Updates and MunEDA R&D-Roadmap F. Schenkel, VP Research & Development, MunEDA GmbH
10:20 – 10:45	Infineon: Yield Enhancement Techniques for Deep-Submicron Technologies B. Lemaitre, O. Rizzo, Infineon Technologies AG
10:45 – 11:10	Bosch: Design Analysis and Optimisation of Automotive Sensor Circuits M. Barth, Robert Bosch GmbH
11:10 – 11:30	Coffee & Discussion Break
11:30 – 12:50	Session 6
11:30 – 11:55	Faraday Technology Corp.: IP porting & Analog Synthesis Automation Platform using WiCkeDTM W. Woei-Tzy Jong (鐘偉滋), Faraday Technology Corp.
11:55 – 12:20	Infineon: Statistical Modeling and Simulation in Automotive Power Circuit Development K.-W. Pieper, Infineon Technologies AG
12:20 – 12:50	ST-NXP Wireless: Circuit Design Optimization Cases for Wireless Cellular Communication D. Chollat-Namy, C. Vaganay, ST-NXP Wireless
12:50 – 13:30	Lunch Break
13:30 – 14:40	Session 7
13:30 – 14:00	Mentor Graphics® / MunEDA – Integration of WiCkeDTM into Mentor Graphics Custom IC Flow with ICstudioTM, DesignArchitect®-ICTM and Eldo® C. Parg, Mentor Graphics V. Glöckel, MunEDA GmbH
14:00 – 14:20	LTE / Infineon: Statistical effects of NBTI degradation in SRAM cells T. Fischer, TU Munich / Infineon Technologies AG
14:20 – 14:40	Wrap-up Day 2, Discussion and End of Conference

Vinorant Alter Hof

Here you will find the password protected MUGM 2008 proceedings:

https://www.muneda.com/mugm/mugm-2008/proceedings/