MUGM 2007

We are pleased to invite you to the MunEDA Users Group Meeting 2007.

MUGM 2007 will take place on September 25^th & 26^th (Tue/Wed), 2007 in Munich, Germany. The goal of the event is an intensive exchange of knowledge by new and experienced industrial users. MUGM provides an open forum for engineers interested in MunEDA solutions for Custom IC Design Migration, Analysis, Modelling and Optimization.

This years focus of the MunEDA User Group Meeting 2007 will be the special topic:

Design Flow & Technology Integration of Nominal and Statistical Sizing Methods

Selection of Presentation Topics at MUGM 2007:

Tuesday, 25th September, 2007

09:30 – 10:00	Registration & Welcome Coffee
10:00 – 11:00	Session 1
10:00 – 10:30	MunEDA – Welcome & Whats new A. Ripp, VP Sales & Marketing, MunEDA
10:30 – 11:00	Optimization of I/O Macro Cells with WiCkeD M. Mauthe, A. Hebenstreit, Infineon AG
11:00 – 11:20	Coffee & Discussion Break
11:20 – 12:20	Session 2
11:20 – 11:50	Designflow Architecture and Integration of Statistical Sizing Methods in STMicroelectronics Non-Volatile-Memory (NVM) and Automotive Flow P. Daglio, STMicroelectronics
11:50 – 12:20	Robust and Reliable Analog Design for Automotive and Sensor Applications by Combining Design Centering and SOA Techniques U. Sobe, K.-H. Rooch, ZMD AG
12:20 – 13:30	Lunch Break
13:30 – 14:45	Session 3
13:30 – 13:45	HOT-Topics J. Qiu, MunEDA GmbH
13:45 – 14:15	MunEDA Tools and R&D-Roadmap F. Schenkel, VP Research & Development, MunEDA GmbH
14:15 – 14:45	Automatic Analog Circuit Synthesis using WiCkeD X. Wang, Johann-Wolfgang Goethe Universität Frankfurt am Main
14:45 – 15:00	Coffee & Discussion Break
15:00 – 15:45	Session 4
15:00 – 15:20	Integration of Statistical Sizing Methods in Infineon Analog-Mixed-Signal-Flow E. Hennig, Infineon AG
15:20 – 15:45	Analysis and Optimization of a CMOS Mixer Circuit R. Frevert, T. Markwirth, U. Knöchel, R. Jancke, Fraunhofer IIS EAS
15:45 – 16:00	Wrap-up Day 1, Discussion and Directions A. Ripp, VP Sales & Marketing, MunEDA GmbH
From 16:30	Social Event at Munich Oktoberfest

Wednesday, 26th September, 2007

10:00 – 11:15	Session 5
10:00 – 10:30	PLL Hierarchical Optimization Methodology Considering Jitter, Power and Locking Time J. Zou, Qimonda AG H. Gräb, D. Müller, U. Schlichtmann, Technical University of Munich
10:30 – 11:15	Basics of Analog Circuit Modelling and Simulation R. Sommer, TU Ilmenau / IMMS gGbmH
11:15 – 11:30	Coffee & Discussion Break
11:30 – 12:30	Session 6
11:30 – 12:00	WiCkeDTM Circuit Optimization Examples: A) Optimization and Centering of the Basic Cells of SRAM Memories B) Performance and Yield Optimization of Sense Amplifier for Automotive Applications E. Raciti, STMicroelectronics
12:00 – 12:30	Qualification of WiCkeDTM for the austriamicrosystems DFM-DFY design flow T. Mörth, austriamicrosystems AG
12:30 – 13:30	Lunch Break
13:30 – 14:30	Session 7
13:30 – 14:00	Automatic Flow for Library Cell Optimization T. Vogels, MunEDA Inc. K. Singhal, Synopsys Scientist, IEEE Fellow
14:00 – 14:30	Technology Setup for WiCkeDTM in X-FAB CMOS and BiCMOS Process for Automotive and Sensor Applications V. Boos, IMMS gGmbH H. Wald, X-FAB Semiconductor Foundries AG
14:30 – 15:00	Coffee & Discussion Break
15:00 – 15:45	Session 8
15:00 – 15:45	Special Topics: – IP Porting – Local Variations (Analog & Digital) M. Pronath, VP Products & Solutions, MunEDA GmbH
15:45 – 16:00	Wrap-up Day 2, Discussion and End of Conference

Munich Oktoberfest – Ochsenbraterei

Here you will find the password protected MUGM 2007 proceedings:

https://www.muneda.com/mugm/mugm-2007/proceedings/