Overview
We are pleased to invite you to the MunEDA Users Group Meeting 2013.
MUGM 2013 will take place on October 10th & 11th (Thu/Fri), 2013 in Munich, Germany. The goal of the event is an intensive exchange of knowledge by new and experienced industrial users. MUGM provides an open forum for engineers interested in MunEDA solutions for Custom IC Design Migration, Analysis, Modelling and Optimization.
This years focus of the MunEDA User Group Meeting 2013 will be the special topic:
Circuit Design Migration, High-Sigma Analysis & Verification and Circuit Optimization in Nanometer Technologies
Date:
October 10 – 10:30 a.m. to 06:00 p.m.
October 11 – 09:00 a.m. to 06:00 p.m.
Location:
Holiday Inn Munich
Hochstrasse 3
81669 Munich, Germany
Selection of Presentation Topics at MUGM 2013:
- Design Migration & Schematic Porting
- Design analysis and sizing for FinFet Technologies
- Design analysis and sizing for FDSOI Technologies
- Management of design contraints and sizing rules
- Corner and statistical verification
- Monte-Carlo Roma and Yield Analysis
- Worst-Case and High-Sigma Statistical Analysis
- Circuit Modelling and Model Generation
- Circuit sizing and optimization
- IP sizing in Nanometer process technologies
- Memory, Standard Cell, IP Libraries, RF-Design
- Low-Power design analysis and optimization
Proceedings