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MUGM 2013


We are pleased to invite you to the MunEDA Users Group Meeting 2013.

MUGM 2013 will take place on October 10th & 11th (Thu/Fri), 2013 in Munich, Germany. The goal of the event is an intensive exchange of knowledge by new and experienced industrial users. MUGM provides an open forum for engineers interested in MunEDA solutions for Custom IC Design Migration, Analysis, Modelling and Optimization.

This years focus of the MunEDA User Group Meeting 2013 will be the special topic:

Circuit Design Migration, High-Sigma Analysis & Verification and Circuit Optimization in Nanometer Technologies

October 10 – 10:30 a.m. to 06:00 p.m.
October 11 – 09:00 a.m. to 06:00 p.m.

Holiday Inn Munich
Hochstrasse 3
81669 Munich, Germany

Selection of Presentation Topics at MUGM 2013:

  • Design Migration & Schematic Porting
  • Design analysis and sizing for FinFet Technologies
  • Design analysis and sizing for FDSOI Technologies
  • Management of design contraints and sizing rules
  • Corner and statistical verification
  • Monte-Carlo Roma and Yield Analysis
  • Worst-Case and High-Sigma Statistical Analysis
  • Circuit Modelling and Model Generation
  • Circuit sizing and optimization
  • IP sizing in Nanometer process technologies
  • Memory, Standard Cell, IP Libraries, RF-Design
  • Low-Power design analysis and optimization

Thursday, 10th October, 2013

09:30 – 10:30Registration & Welcome Coffee
10:30 – 12:30Session 1: Keynotes & What’s new
10:30 – 10:45STMicroelectronics – MUGM 2013 Chair Opening Remarks
P. Daglio, STMicroelectronics – MUGM 2013 Conference Chair
10:45 – 11:00MunEDA – Welcome & Whats new
A. Ripp, VP Sales & Marketing, MunEDA
11:00 – 11:45GLOBALFOUNDRIES – Keynote – Challenges in Deep-Submicron Technologies – Design Migration & Reuse
11:45 – 12:30Berkeley Design Automation – Nanometer Circuit Verification & Analog Characterization Environment
P. Estrada, Berkeley Design Automation
12:30 – 13:45MUGM Group Picture & Lunch Break
13:45 – 15:30Session 2: Nanometer Verification & Design Environments
13:45 – 14:10MunEDA – What’s new in WiCkeD 6.6 – Integration & R&D Roadmap
F. Schenkel, VP Research & Development, MunEDA
14:10 – 14:35Altera – Power and performance optimization with transistor variables on custom circuits using MunEDA WiCkeD
G. H. Oh, Altera
14:35 – 15:00STMicroelectronics Crolles – WiCkeD/Virtuoso Design Intents Flow for STMicroelectronics CMOS14FDSOI (14nm)
R. Stewart, STMicroelectronics
15:00- 15:30MunEDA Tutorial – Analyzing the Effects of Process Variation and Mismatch on Circuit Design: Monte Carlo and Alternatives (Part 1)
M. Pronath, VP Products & Solutions, MunEDA
15:30 – 16:15Coffee Break – Demos & Exhibition
16:15 – 18:00Session 3: RF Design
16:15 – 16:45Lantiq – Process Characterization in 40nm and Level Shifter Optimization in 65nm (RF Design)
G. Golla, Lantiq
16:45 – 17:10STMicroelectronics Catania – Application of MunEDA WiCkeD – Agilent GoldenGate integration for corner analysis and sizing of RF circuits
A. Ciccazzo, STMicroelectronics
17:10 – 17:30FAU – University Erlangen-Nuernberg – Verification and Optimization of Digital Radio Receiver Sub Circuits (LFoundry 150nm)
C. Schmidt, University Erlangen
17:30 – 18:00STMicroelectronics Castelletto – Analysis and improvements for the AM RF section of a CMOS Tuner
A. Colaci, A. Capasso, STMicroelectronics
18:00- 18:05Wrap-up Day 1 and Directions
A. Ripp, VP Sales & Marketing, MunEDA
From 19:30Social Event at Zum Franziskaner

Friday, 11th October, 2013

09:00 – 10:30Session 4: Analog, MEMS & System-Level Design
09:00 – 09:30IMMS – Using WiCkeD in MEMS design
V. Boos, IMMS
09:30 – 10:00Fraunhofer – Noise and performances analysis of a 180 nm CMOS OPAMP with WiCkeD
J. Ferro Sanchez, Fraunhofer
10:00 – 10:30Fraunhofer – COSIDE: A new solution for heterogeneous system specification
T. Hartung, K. Einwich, Fraunhofer
10:30 – 11:15Coffee Break – Demos & Exhibition
11:15 – 13:00Session 5: Low Power & Standard Cell Design
11:15 – 11:45MunEDA Tutorial – Low Power OpAmp Optimization with WiCkeD
M. Siu, Application Engineer, MunEDA
11:45 – 12:10SKHynix – NAND Flash Cell Sensing Sensitivity Analysis & Improvement with WiCkeD
J. H. Lee, SKHynix
12:10 – 12:30University Frankfurt/Main – An Unattended Circuit Optimization Flow for Digital Standard Cells using WiCkeD
M. Meissner, University Frankfurt/Main
12:30 – 13:00STMicroelectronics Crolles – Overview of WiCkeD capabilities for Standard Cell Performances Optimization & High Sigma Yield Analysis
N. B. Salem, STMicroelectronics
13:00 – 14:30Lunch Break
14:30 – 15:50Session 6: I/O, Memory & IP Design
14:30 – 14:50MunEDA Tutorial – Increase Efficiency and Quality of I/O Design by Circuit Sizing
M. Pronath, VP Products & Solutions, MunEDA
14:50 – 15:10STMicroelectronics Noida – Design optimization in deep-submicron technologies covering methodology for reliability based circuit optimization for IOs
A. Gupta, STMicroelectronics
15:10 – 15:30Samsung – AutoScript based WiCkeD design optimization flow setup for FinFET high-speed memory interface design
J. Park, Samsung
15:30 – 15:50viimagic – FTP (Foundry-Technology-Platform) Porting of an AMS IP (ADC Buffer) to LFoundry LF150 using MunEDA WiCkeD and IPGen 1Stone on viimagic inhouse flow
A. Momin, viimagic
15:50 – 16:30Coffee Break – Demos & Exhibition
16:30 – 17:30Session 7: Nanometer Verification & RFID
16:30- 17:15MunEDA Tutorial – Analyzing the Effects of Process Variation and Mismatch on Circuit Design: Monte Carlo and Alternatives (Part 2)
M. Pronath, VP Products & Solutions, MunEDA
17:15 – 17:30CEITEC – RFID, Wireless Communications and Digital Multimedia Technology made in Brasil
F. Chavez, CEITEC
17:30 – 17:45Wrap-up & Farewell
Social Event

Zum Franziskaner


Residenzstraße 9
80333 Munich

fon: +49 89 / 23 18 120
directions: Google Maps


Here you will find the password protected MUGM 2013 proceedings:

To view the password protected MUGM Proceedings, send us a request

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