MUGM 2013

We are pleased to invite you to the MunEDA Users Group Meeting 2013.

MUGM 2013 will take place on October 10^th & 11^th (Thu/Fri), 2013 in Munich, Germany. The goal of the event is an intensive exchange of knowledge by new and experienced industrial users. MUGM provides an open forum for engineers interested in MunEDA solutions for Custom IC Design Migration, Analysis, Modelling and Optimization.

This years focus of the MunEDA User Group Meeting 2013 will be the special topic:

Circuit Design Migration, High-Sigma Analysis & Verification and Circuit Optimization in Nanometer Technologies

Selection of Presentation Topics at MUGM 2013:

Thursday, 10th October, 2013

09:30 – 10:30	Registration & Welcome Coffee
10:30 – 12:30	Session 1: Keynotes & What’s new
10:30 – 10:45	STMicroelectronics – MUGM 2013 Chair Opening Remarks P. Daglio, STMicroelectronics – MUGM 2013 Conference Chair
10:45 – 11:00	MunEDA – Welcome & Whats new A. Ripp, VP Sales & Marketing, MunEDA
11:00 – 11:45	GLOBALFOUNDRIES – Keynote – Challenges in Deep-Submicron Technologies – Design Migration & Reuse G. Teepe, GLOBALFOUNDRIES
11:45 – 12:30	Berkeley Design Automation – Nanometer Circuit Verification & Analog Characterization Environment P. Estrada, Berkeley Design Automation
12:30 – 13:45	MUGM Group Picture & Lunch Break
13:45 – 15:30	Session 2: Nanometer Verification & Design Environments
13:45 – 14:10	MunEDA – What’s new in WiCkeD 6.6 – Integration & R&D Roadmap F. Schenkel, VP Research & Development, MunEDA
14:10 – 14:35	Altera – Power and performance optimization with transistor variables on custom circuits using MunEDA WiCkeD G. H. Oh, Altera
14:35 – 15:00	STMicroelectronics Crolles – WiCkeD/Virtuoso Design Intents Flow for STMicroelectronics CMOS14FDSOI (14nm) R. Stewart, STMicroelectronics
15:00- 15:30	MunEDA Tutorial – Analyzing the Effects of Process Variation and Mismatch on Circuit Design: Monte Carlo and Alternatives (Part 1) M. Pronath, VP Products & Solutions, MunEDA
15:30 – 16:15	Coffee Break – Demos & Exhibition
16:15 – 18:00	Session 3: RF Design
16:15 – 16:45	Lantiq – Process Characterization in 40nm and Level Shifter Optimization in 65nm (RF Design) G. Golla, Lantiq
16:45 – 17:10	STMicroelectronics Catania – Application of MunEDA WiCkeD – Agilent GoldenGate integration for corner analysis and sizing of RF circuits A. Ciccazzo, STMicroelectronics
17:10 – 17:30	FAU – University Erlangen-Nuernberg – Verification and Optimization of Digital Radio Receiver Sub Circuits (LFoundry 150nm) C. Schmidt, University Erlangen
17:30 – 18:00	STMicroelectronics Castelletto – Analysis and improvements for the AM RF section of a CMOS Tuner A. Colaci, A. Capasso, STMicroelectronics
18:00- 18:05	Wrap-up Day 1 and Directions A. Ripp, VP Sales & Marketing, MunEDA
From 19:30	Social Event at Zum Franziskaner

Friday, 11th October, 2013

09:00 – 10:30	Session 4: Analog, MEMS & System-Level Design
09:00 – 09:30	IMMS – Using WiCkeD in MEMS design V. Boos, IMMS
09:30 – 10:00	Fraunhofer – Noise and performances analysis of a 180 nm CMOS OPAMP with WiCkeD J. Ferro Sanchez, Fraunhofer
10:00 – 10:30	Fraunhofer – COSIDE: A new solution for heterogeneous system specification T. Hartung, K. Einwich, Fraunhofer
10:30 – 11:15	Coffee Break – Demos & Exhibition
11:15 – 13:00	Session 5: Low Power & Standard Cell Design
11:15 – 11:45	MunEDA Tutorial – Low Power OpAmp Optimization with WiCkeD M. Siu, Application Engineer, MunEDA
11:45 – 12:10	SKHynix – NAND Flash Cell Sensing Sensitivity Analysis & Improvement with WiCkeD J. H. Lee, SKHynix
12:10 – 12:30	University Frankfurt/Main – An Unattended Circuit Optimization Flow for Digital Standard Cells using WiCkeD M. Meissner, University Frankfurt/Main
12:30 – 13:00	STMicroelectronics Crolles – Overview of WiCkeD capabilities for Standard Cell Performances Optimization & High Sigma Yield Analysis N. B. Salem, STMicroelectronics
13:00 – 14:30	Lunch Break
14:30 – 15:50	Session 6: I/O, Memory & IP Design
14:30 – 14:50	MunEDA Tutorial – Increase Efficiency and Quality of I/O Design by Circuit Sizing M. Pronath, VP Products & Solutions, MunEDA
14:50 – 15:10	STMicroelectronics Noida – Design optimization in deep-submicron technologies covering methodology for reliability based circuit optimization for IOs A. Gupta, STMicroelectronics
15:10 – 15:30	Samsung – AutoScript based WiCkeD design optimization flow setup for FinFET high-speed memory interface design J. Park, Samsung
15:30 – 15:50	viimagic – FTP (Foundry-Technology-Platform) Porting of an AMS IP (ADC Buffer) to LFoundry LF150 using MunEDA WiCkeD and IPGen 1Stone on viimagic inhouse flow A. Momin, viimagic
15:50 – 16:30	Coffee Break – Demos & Exhibition
16:30 – 17:30	Session 7: Nanometer Verification & RFID
16:30- 17:15	MunEDA Tutorial – Analyzing the Effects of Process Variation and Mismatch on Circuit Design: Monte Carlo and Alternatives (Part 2) M. Pronath, VP Products & Solutions, MunEDA
17:15 – 17:30	CEITEC – RFID, Wireless Communications and Digital Multimedia Technology made in Brasil F. Chavez, CEITEC
17:30 – 17:45	Wrap-up & Farewell

Zum Franziskaner

Here you will find the password protected MUGM 2013 proceedings:

https://www.muneda.com/mugm/mugm-2013/proceedings/