MunEDA Solutions & Applications
- Low Power Tuning & Sizing for Custom Circuits (Analog, RF)
- Memory Design (SRAM, DRAM, Flash, FPGA)
- Circuit Trimming and Dependend Simulations with Analog Circuits
- Standard Cell & I/O Cell Design Optimization
- Custom IC Design Migration, Verification & Optimization
- High-Sigma Verification for SRAM Designs
- Process Characterization & Backward Process Propagation
- PCM Statistical Parameter Calculation
- Yield Plotting
- RSM Circuit Modelling & Model Generation
- Circuit Sensitivity Analysis in FinFET Technologies
- Fast Hierarchical & High Sigma Monte Carlo
- Verification and Characterization of Analog Circuits
- PVT & Worst Case Corner Run Analysis of Custom IC & IP
HLMC Shanghai Huali Microelectronics Corporation at MUGM MunEDA User Group Meeting
“With MunEDA tools SPT and DNO we could successfully migrate and optimize for high gain our designs
from 55nm to 40nm and simultaneously verify for required PVT corner and statistical variation yield analysis.”
Let’s work together on your
next design project
Use MunEDA tools and support to speed up efficiency,
quality and outcome of your next circuit design project