Low Power Tuning & Sizing for Custom Circuits (Analog, RF)

Custom IC Design Migration, Verifica-tion & Optimization

High Sigma Verification for SRAM Design

Process Characteri-zation & Backward Process Propagation

PCM Statistical Parameter Calculation

RSM Circuit Modelling & Model Generation

Circuit Sensitivity Analysis in FinFET Technologies

Fast Hierarchical & High Sigma Monte Carlo

Trimming and Optimization of Analog Circuits

PVT & Worst Case Corner Run Analysis of Custom IC & IP

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HLMC Shanghai Huali Microelectronics Corporation at MUGM MunEDA User Group Meeting

“With MunEDA tools SPT and DNO we could successfully migrate and optimize for high gain our designs
from 55nm to 40nm and simultaneously verify for required PVT corner and statistical variation yield analysis.”

Let’s work together on your
next design project

Use MunEDA tools and support to speed up efficiency,
quality and outcome of your next circuit design project