Overview
We are pleased to invite you to the MunEDA Users Group Meeting 2014.
MUGM 2014 will take place on November 17th & 18th (Mon/Tue), 2014 in Munich, Germany. The goal of the event is an intensive exchange of knowledge by new and experienced industrial users. MUGM provides an open forum for engineers interested in MunEDA solutions for Custom IC Design Migration, Analysis, Modelling and Optimization.
This years focus of the MunEDA User Group Meeting 2014 will be the special topic:
Full Custom Design Migration, Verification & Optimization in Advanced Node Technologies
Date:
November 17 – 10:30 a.m. to 06:00 p.m.
November 18 – 09:00 a.m. to 06:00 p.m.
Location:
Le Méridien
Bayerstraße 41
80335 Munich, Germany
Selection of Presentation Topics at MUGM 2014:
- Fast and reliable full custom design migration
- Design analysis and sizing in FinFet & FDSOI Technologies
- Optimizing memory designs and full custom digital designs
- Post-silicon debugging of AMS/RF circuits
- Characterizing and optimizing standard cell libraries for statistical parametric robustness
- Circuit sizing and constraint management for low power AMS/RF designs
- Fast parametric verification for PVT corners and mismatch
- Monte Carlo and Yield Analysis
- Worst-Case Analysis and High-Sigma Statistical Analysis
- Advances in Circuit Model Generation
Proceedings