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MUGM 2015


We are pleased to invite you to the MunEDA Users Group Meeting 2015.

MUGM 2015 will take place on October 27th & 28th (Tue/Wed), 2015 in Munich, Germany. The goal of the event is an intensive exchange of knowledge by new and experienced industrial users. MUGM provides an open forum for engineers interested in MunEDA solutions for Custom IC Design Migration, Analysis, Modelling and Optimization.

This years focus of the MunEDA User Group Meeting 2015 will be the special topic:

Methods for High-Sigma Verification and Low-Power Optimization of Custom IC Designs

October 27 – 09:30 a.m. to 06:00 p.m.
October 28 – 10:00 a.m. to 05:30 p.m.

Platzl Hotel
Sparkassenstrasse 10
80331 Munich, Germany

Selection of Presentation Topics at MUGM 2015:

  • Custom Circuit Design Migration and IP Porting
  • Low-Power Optimization of Custom IC Designs
  • Advanced Node Design (FinFET, FDSOI)
  • (Ultra-)High-Sigma & Yield Analysis and Optimization
  • Memory Design (SRAM, DRAM, Flash, FPGA, FTP, PCM)
  • Standard Cell & I/O Library Design
  • Circuit & Process Modelling and Model Characterization
  • Reliability, Aging & Degradation based Design
  • Circuit Robustness Verification and Sign-off
  • Multiple topologies exploration
  • Smart power applications in general
  • High power designs (BCD technologies)

Tuesday, 27th October, 2015
09:30 – 10:30Registration & Welcome Coffee
10:30 – 12:00Technical Session D1.1: Opening & What’s new
10:30MunEDA – Welcome & Whats new
A. Ripp, VP Sales & Marketing, MunEDA
10:45STMicroelectronics – MUGM 2015 Chair Opening Remarks & Keynote Speech – MUGM 10 Year Anniversary
P. Daglio, STMicroelectronics – MUGM 2015 Conference Chair
11:30MunEDA – What’s new in WiCkeD 6.8 – Integration & R&D Roadmap
F. Schenkel, VP Research & Development, MunEDA
11:50Empyrean – One-Stop Layout Analysis Platform – Skipper
O. Wei, Empyrean
12:15MUGM Group Picture
All Participants
12:20 – 13:45Lunch Break
13:45 – 15:30Technical Session D1.2
13:45MunEDA – WiCkeD 6.8 Tool Demo – Enhancements & New Features
M. Sylvester, MunEDA
14:15Fraunhofer – Speedup performance calculation with SpectreMDL and external extractor script
E. Herzer, Fraunhofer IIS
14:40SMIC – Optimization for extreme low power dissipation of bandgap designs with WiCkeD
Z. Deng, J. Yang, SMIC
O. Wei, Empyrean
15:05MunEDA – Hierarchical SRAM worst-case analysis (Tutorial)
M. Yakupov, MunEDA
15:30 – 16:15Coffee Break – Demos & Exhibition
16:15 – 18:00Technical Session D1.3
16:15MunEDA – MunEDA R&D Updates – Flexible goals for yield optimization
D. Pronath, MunEDA
16:40SK Hynix – Fail-analysis practices with WiCkeD tool – Bandgap reference circuit in nonvolatile memory
J. Kim, SKHynix
17:05STMicroelectronics – Reliability-aware design with WiCkeD in FDSOI Technologies
V. Huard, STMicroelectronics (Crolles)
17:30MunEDA – Multi stage worst-case analysis
D. Plant, MunEDA
17:55Wrap-up Day 1 and Directions
A. Ripp, VP Sales & Marketing, MunEDA
From 19:30Social Event (See also Social Event)
Wednesday, 28th October, 2015
10:00 – 12:00Technical Session D2.1
10:00University Jena – Optimization of Settling Time and Stability for a Low-power Fully-differential Operational Amplifier with WiCkeD
D. Schreiber, University Jena
10:30STMicroelectronics – Design of the BandGap voltage reference in 40nm technology using WiCkeD features of Optimization and feasibility
P. A. Coppa, STMicroelectronics (Catania)
11:00MunEDA – Parameter Screening methods in WiCkeD 6.8 (Tutorial)
V. Glöckel, MunEDA
11:30MUGM GUniversity Rome – Optimal NBTI Degradation and PVT Variation Resistant Device Sizing in a Full Adder Cell
U. Khalid, Z. Abbas, Sapienza University Rome
12:00 – 13:30Lunch Break
13:30 – 15:15Technical Session D2.2
13:30MunEDA – Update to the Brasilian Semiconductor Ecosystem
G. Strube, MunEDA
13:45CEITEC S.A – Trade-off Analysis between Area and Yield/Robustness demonstrated on a Bandgap Circuit
D. B. Karolak, Ceitec
14:15Institute for Advanced Studies – Circuit Design Optimization with WiCkeD for Radiation Hardening
P. Agostino, Institute for Advanced Studies
14:45X-Fab – Rapid adoption of MUNEDA design flows using X-FAB’s AMS Reference Kit
J. Doblaski, X-Fab (Erfurt)
15:15 – 16:00Coffee Break – Demos & Exhibition
16:00 – 17:10Technical Session D2.3
16:00STMicroelectronics – Performance enhancement of CMOS tuner cells without increasing the area
A. Ciccazzo, A. Capasso, STMicroelectronics (Catania/Castelletto)
16:30MunEDA – Speed-up of OCV Characterization of Standard Cell Libraries with WiCkeD
M. Yakupov, MunEDA
17:00Best Paper Award and Prize Draw
A tablet and other cool stuff will be drawn
17:10 – 17:30Wrap-up & Farewell
Social Event

Wirtshaus Ayingers


Wirtshaus Ayingers
Platzl 1a
80331 Munich

fon: +49 (0)89 / 23-70-36-66
directions: Google Maps


To get MUGM Proceedings, send us a request