Overview
We are pleased to invite you to the MunEDA Users Group Meeting 2015.
MUGM 2015 will take place on October 27th & 28th (Tue/Wed), 2015 in Munich, Germany. The goal of the event is an intensive exchange of knowledge by new and experienced industrial users. MUGM provides an open forum for engineers interested in MunEDA solutions for Custom IC Design Migration, Analysis, Modelling and Optimization.
This years focus of the MunEDA User Group Meeting 2015 will be the special topic:
Methods for High-Sigma Verification and Low-Power Optimization of Custom IC Designs
Date:
October 27 – 09:30 a.m. to 06:00 p.m.
October 28 – 10:00 a.m. to 05:30 p.m.
Location:
Platzl Hotel
Sparkassenstrasse 10
80331 Munich, Germany
Selection of Presentation Topics at MUGM 2015:
- Custom Circuit Design Migration and IP Porting
- Low-Power Optimization of Custom IC Designs
- Advanced Node Design (FinFET, FDSOI)
- (Ultra-)High-Sigma & Yield Analysis and Optimization
- Memory Design (SRAM, DRAM, Flash, FPGA, FTP, PCM)
- Standard Cell & I/O Library Design
- Circuit & Process Modelling and Model Characterization
- Reliability, Aging & Degradation based Design
- Circuit Robustness Verification and Sign-off
- Multiple topologies exploration
- Smart power applications in general
- High power designs (BCD technologies)
Program
Tuesday, 27th October, 2015
| 09:30 – 10:30 | Registration & Welcome Coffee |
| 10:30 – 12:00 | Session 1 |
| 10:30 – 10:45 | MunEDA – Welcome & Whats new A. Ripp, VP Sales & Marketing, MunEDA |
| 10:45 – 11:30 | STMicroelectronics – MUGM 2015 Chair Opening Remarks & Keynote Speech – MUGM 10 Year Anniversary P. Daglio, STMicroelectronics – MUGM 2015 Conference Chair |
| 11:30 – 11:50 | MunEDA – What’s new in WiCkeD 6.8 – Integration & R&D Roadmap F. Schenkel, VP Research & Development, MunEDA |
| 11:50 – 12:15 | Empyrean – One-Stop Layout Analysis Platform – Skipper O. Wei, Empyrean |
| 12:15 – 12:20 | MUGM Group Picture All Participants |
| 12:20 – 13:45 | Lunch Break |
| 13:45 – 15:30 | Session 2 |
| 13:45 – 14:15 | MunEDA – WiCkeD 6.8 Tool Demo – Enhancements & New Features M. Sylvester, MunEDA |
| 14:15 – 14:40 | Fraunhofer – Speedup performance calculation with SpectreMDL and external extractor script E. Herzer, Fraunhofer IIS |
| 14:40 – 15:05 | SMIC – Optimization for extreme low power dissipation of bandgap designs with WiCkeD Z. Deng, J. Yang, SMIC O. Wei, Empyrean |
| 15:05 – 15:30 | MunEDA – Hierarchical SRAM worst-case analysis (Tutorial) M. Yakupov, MunEDA |
| 15:30 – 16:15 | Coffee Break – Demos & Exhibition |
| 16:15 – 18:00 | Session 3 |
| 16:15 – 16:40 | MunEDA – MunEDA R&D Updates – Flexible goals for yield optimization D. Pronath, MunEDA |
| 16:40 – 17:05 | SK Hynix – Fail-analysis practices with WiCkeD tool – Bandgap reference circuit in nonvolatile memory J. Kim, SKHynix |
| 17:05 – 17:30 | STMicroelectronics – Reliability-aware design with WiCkeD in FDSOI Technologies V. Huard, STMicroelectronics (Crolles) |
| 17:30 – 17:55 | MunEDA – Multi stage worst-case analysis D. Plant, MunEDA |
| 17:55 – 18:00 | Wrap-up Day 1 and Directions A. Ripp, VP Sales & Marketing, MunEDA |
| From 19:30 | Social Event at Wirtshaus Ayingers |
Wednesday, 28th October, 2015
| 10:00 – 12:00 | Session 4 |
| 10:00 – 10:30 | University Jena – Optimization of Settling Time and Stability for a Low-power Fully-differential Operational Amplifier with WiCkeD D. Schreiber, University Jena |
| 10:30 – 11:00 | STMicroelectronics – Design of the BandGap voltage reference in 40nm technology using WiCkeD features of Optimization and feasibility P. A. Coppa, STMicroelectronics (Catania) |
| 11:00 – 11:30 | MunEDA – Parameter Screening methods in WiCkeD 6.8 (Tutorial) V. Glöckel, MunEDA |
| 11:30 – 12:00 | University Rome – Optimal NBTI Degradation and PVT Variation Resistant Device Sizing in a Full Adder Cell U. Khalid, Z. Abbas, Sapienza University Rome |
| 12:00 – 13:30 | Lunch Break |
| 13:30 – 15:15 | Session 5 |
| 13:30 – 13:45 | MunEDA – Update to the Brasilian Semiconductor Ecosystem G. Strube, MunEDA |
| 13:45 – 14:15 | CEITEC S.A – Trade-off Analysis between Area and Yield/Robustness demonstrated on a Bandgap Circuit D. B. Karolak, Ceitec |
| 14:15 – 14:45 | Institute for Advanced Studies – Circuit Design Optimization with WiCkeD for Radiation Hardening P. Agostino, Institute for Advanced Studies |
| 14:45 – 15:15 | X-Fab – Rapid adoption of MUNEDA design flows using X-FAB’s AMS Reference Kit J. Doblaski, X-Fab (Erfurt) |
| 15:15 – 16:00 | Coffee Break – Demos & Exhibition |
| 16:00 – 17:10 | Session 6 |
| 16:00 – 16:30 | STMicroelectronics – Performance enhancement of CMOS tuner cells without increasing the area A. Ciccazzo, A. Capasso, STMicroelectronics (Catania/Castelletto) |
| 16:30 – 17:00 | MunEDA – Speed-up of OCV Characterization of Standard Cell Libraries with WiCkeD M. Yakupov, MunEDA |
| 17:00 – 17:10 | Best Paper Award and Prize Draw A tablet and other cool stuff will be drawn |
| 17:10 – 17:30 | Wrap-up & Farewell |
Social Event
Wirtshaus Ayingers
Proceedings
Here you will find the password protected MUGM 2015 proceedings:
https://www.muneda.com/mugm/mugm-2015/proceedings/