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MUGM 2009


We are pleased to invite you to the MunEDA Users Group Meeting 2009.

MUGM 2009 will take place on November 12th & 13th (Thu/Fri), 2009 in Munich, Germany. The goal of the event is an intensive exchange of knowledge by new and experienced industrial users. MUGM provides an open forum for engineers interested in MunEDA solutions for Custom IC Design Migration, Analysis, Modelling and Optimization.

This years focus of the MunEDA User Group Meeting 2009 will be the special topic:

Methodologies for Time-Efficient Design, Rapid IP Porting and Technology Migration

November 12 – 10:30 a.m. to 06:00 p.m.
November 13 – 09:00 a.m. to 06:00 p.m.

Hilton Munich City
Rosenheimer Straße 15
81667 Munich, Germany

Selection of Presentation Topics at MUGM 2009:

  • Handling Design Contraints & Sizing Rules
  • IP Porting & Technology Migration
  • Design Performance & Specification Analysis
  • Design Performance & Specification Analysis
  • Response Surface Modelling & Model Generation
  • Circuit Design Optimization & Verification
  • Statistical Circuit Analysis & Optimization
  • Multi-Testbench Environment & Corner Based Optimization
  • Worst-Case Distance Analysis & Optimization
  • Design Shrink & Nano-scale Circuit optimization
  • Industrial Design Cases

Thursday, 12th November, 2009

09:30 – 10:30Registration & Welcome Coffee
10:30 – 12:00Session 1
10:30 – 10:45MunEDA – Welcome & Whats new
A. Ripp, VP Sales & Marketing, MunEDA
10:45 – 11:30KEYNOTE – STARC – Tools, Trends & Strategic Challenges for the Global Semiconductor Industry
K. Tsuboi, Semiconductor Technology Academic Research Center
11:30 – 12:00STMicroelectronics: Worst Case Analysis and Yield Optimizationof a micro-power precision OpAmp based on an advanced Offset Cancellation Chopper technique in HF7CMOS (350nm) from APM-IMS with WiCkeD
A. Ciccazzo, STMicroelectronics Srl.
12:00 – 13:30Lunch Break
13:30 – 15:30Session 2
13:30 – 13:55IPGEN: Automatic Analog IP Generation with: 1Stone®
D. Friebel, IPGEN GmbH
13:55 – 14:20STMicroelectronics – WiCkeD Application Case: Design and characterization of a dither VCO for mixed signal application at different levels of abstraction
A. Colaci, STMicroelectronics Srl.
14:20 – 15:05MunEDA: WiCkeDTM 6.0 – Software Tutorial & Release Updates
B. Obermeier, MunEDA GmbH
15:05 – 15:30BOSCH – Methods of Usage Measurement for WiCkeD in Bosch Automotive Design Flow
M. Barth, Robert Bosch GmbH
15:30 – 16:00Coffee & Discussion Break
16:00 – 18:00Session 3
16:00 – 16:30LANTIQ: The Stepchild Parametric Yield
G. E. Müller-L., Lantiq GmbH
16:30 – 17:00ATMEL: Modelling of Multi-Stage Amplifiers with WiCkeD
W. Schneider, H.-W. Groh, S. Kern, Atmel Germany GmbH
17:00 – 17:30Infineon: Architectural Assessment of Design Techniques to Improve Speed and Robustness in Embedded Microprocessor
T. Baumann, Infineon Technologies AG
17:30 – 18:00IMMS: Analysis of frequency-optimized transimpedance amplifiers in XFAB 600nm BiCMOS technology
D. Krauße, TU-Ilmenau/IMMS GmbH
18:00 – 18:05Wrap-up Day 1 and Directions
A. Ripp, VP Sales & Marketing, MunEDA
From 19:00Social Event at Hofbräukeller

Friday, 13th November, 2009

09:00 – 10:30Session 4
09:00 – 09:30MunEDA Tools and R&D Roadmap
F. Schenkel, VP Research & Development, MunEDA GmbH
09:30 – 10:00STMicroelectronics: WiCkeD simulation based and modeling approach. Ring oscillator in 65nm non volatile memory technology from TRD-CCDS and low emission I/O pad buffer in 90nm CMOS low power technology from APG Car Radio.
E. Raciti, STMicroelectronics Srl.
10:00 – 10:30TUM Technische Universität München – Towards Reliability Optimization of Analog Integrated Circuits
H. Gräb, Technische Universität München
10:30 – 11:00Coffee & Discussion Break
11:00 – 12:15Session 5
11:00 – 11:25HYNIX – Using WiCkeD in DRAM Development
K.-S. Kim, Hynix Semiconductors Inc.
11:25 – 11:50ZMDI: Analog IP Porting
E. Böhme, ZMD AG
11:50 – 12:15NCU National Central University Taiwan – Analog Behavioral Modeling and Its Application on Yield Enhancement of Analog Circuits
C.-N. Liu, National Central University Taiwan
12:15 – 13:45Lunch Break
13:45 – 15:55Session 6
13:45 – 14:15STMicroelectronics: AMS design flow – Trends, strategic tools and innovative methodologies for deep sub-micron technology nodes
P. Daglio, STMicroelectronics Srl.
14:15 – 14:45IMMS – Design and Optimization of a High-Speed Blu-ray Disc Photodetector IC with WiCkeD
E. Hennig, IMMS GmbH
14:45 – 15:15STMicroelectronics: WiCkeD – Statistical Analysis and Optimization of a Sense Amplifier for very low voltage applications in CMOS 90nm Flash technology from IMS MMS CR&D
M. Micciche, A. Di Martino, STMicroelectronics Srl.
15:15 – 15:45Ulm University for Applied Science: Investigations on Performance and Productivity Improvement of CMOS Circuits for Analog Signal Processing with WiCkeD
F. Mrugalla, G. Vallant, G. Forster, University for Applied Science Ulm
15:45 – 16:15Coffee & Discussion Break
16:15 – 17:15Session 7
16:15 – 17:15Expert Session: WiCkeD – Tool Demos, Q&A & Feedbacks
B. Lemaitre, M. Pronath, MunEDA GmbH
17:15 – 17:30Wrap-up & Farewell
Social Event



Innere Wiener Straße 19
81667 Munich

fon: +49 89 / 45 99 250
directions: Google Maps


Here you will find the password protected MUGM 2009 proceedings:

To view the password protected MUGM Proceedings, send us a request

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