Overview
We are pleased to invite you to the MunEDA Users Group Meeting 2009.
MUGM 2009 will take place on November 12th & 13th (Thu/Fri), 2009 in Munich, Germany. The goal of the event is an intensive exchange of knowledge by new and experienced industrial users. MUGM provides an open forum for engineers interested in MunEDA solutions for Custom IC Design Migration, Analysis, Modelling and Optimization.
This years focus of the MunEDA User Group Meeting 2009 will be the special topic:
Methodologies for Time-Efficient Design, Rapid IP Porting and Technology Migration
Date:
November 12 – 10:30 a.m. to 06:00 p.m.
November 13 – 09:00 a.m. to 06:00 p.m.
Location:
Hilton Munich City
Rosenheimer Straße 15
81667 Munich, Germany
Selection of Presentation Topics at MUGM 2009:
- Handling Design Contraints & Sizing Rules
- IP Porting & Technology Migration
- Design Performance & Specification Analysis
- Design Performance & Specification Analysis
- Response Surface Modelling & Model Generation
- Circuit Design Optimization & Verification
- Statistical Circuit Analysis & Optimization
- Multi-Testbench Environment & Corner Based Optimization
- Worst-Case Distance Analysis & Optimization
- Design Shrink & Nano-scale Circuit optimization
- Industrial Design Cases
Program
Thursday, 12th November, 2009
| 09:30 – 10:30 | Registration & Welcome Coffee |
| 10:30 – 12:00 | Session 1 |
| 10:30 – 10:45 | MunEDA – Welcome & Whats new A. Ripp, VP Sales & Marketing, MunEDA |
| 10:45 – 11:30 | KEYNOTE – STARC – Tools, Trends & Strategic Challenges for the Global Semiconductor Industry K. Tsuboi, Semiconductor Technology Academic Research Center |
| 11:30 – 12:00 | STMicroelectronics: Worst Case Analysis and Yield Optimizationof a micro-power precision OpAmp based on an advanced Offset Cancellation Chopper technique in HF7CMOS (350nm) from APM-IMS with WiCkeD A. Ciccazzo, STMicroelectronics Srl. |
| 12:00 – 13:30 | Lunch Break |
| 13:30 – 15:30 | Session 2 |
| 13:30 – 13:55 | IPGEN: Automatic Analog IP Generation with: 1Stone® D. Friebel, IPGEN GmbH |
| 13:55 – 14:20 | STMicroelectronics – WiCkeD Application Case: Design and characterization of a dither VCO for mixed signal application at different levels of abstraction A. Colaci, STMicroelectronics Srl. |
| 14:20 – 15:05 | MunEDA: WiCkeDTM 6.0 – Software Tutorial & Release Updates B. Obermeier, MunEDA GmbH |
| 15:05 – 15:30 | BOSCH – Methods of Usage Measurement for WiCkeD in Bosch Automotive Design Flow M. Barth, Robert Bosch GmbH |
| 15:30 – 16:00 | Coffee & Discussion Break |
| 16:00 – 18:00 | Session 3 |
| 16:00 – 16:30 | LANTIQ: The Stepchild Parametric Yield G. E. Müller-L., Lantiq GmbH |
| 16:30 – 17:00 | ATMEL: Modelling of Multi-Stage Amplifiers with WiCkeD W. Schneider, H.-W. Groh, S. Kern, Atmel Germany GmbH |
| 17:00 – 17:30 | Infineon: Architectural Assessment of Design Techniques to Improve Speed and Robustness in Embedded Microprocessor T. Baumann, Infineon Technologies AG |
| 17:30 – 18:00 | IMMS: Analysis of frequency-optimized transimpedance amplifiers in XFAB 600nm BiCMOS technology D. Krauße, TU-Ilmenau/IMMS GmbH |
| 18:00 – 18:05 | Wrap-up Day 1 and Directions A. Ripp, VP Sales & Marketing, MunEDA |
| From 19:00 | Social Event at Hofbräukeller |
Friday, 13th November, 2009
| 09:00 – 10:30 | Session 4 |
| 09:00 – 09:30 | MunEDA Tools and R&D Roadmap F. Schenkel, VP Research & Development, MunEDA GmbH |
| 09:30 – 10:00 | STMicroelectronics: WiCkeD simulation based and modeling approach. Ring oscillator in 65nm non volatile memory technology from TRD-CCDS and low emission I/O pad buffer in 90nm CMOS low power technology from APG Car Radio. E. Raciti, STMicroelectronics Srl. |
| 10:00 – 10:30 | TUM Technische Universität München – Towards Reliability Optimization of Analog Integrated Circuits H. Gräb, Technische Universität München |
| 10:30 – 11:00 | Coffee & Discussion Break |
| 11:00 – 12:15 | Session 5 |
| 11:00 – 11:25 | HYNIX – Using WiCkeD in DRAM Development K.-S. Kim, Hynix Semiconductors Inc. |
| 11:25 – 11:50 | ZMDI: Analog IP Porting E. Böhme, ZMD AG |
| 11:50 – 12:15 | NCU National Central University Taiwan – Analog Behavioral Modeling and Its Application on Yield Enhancement of Analog Circuits C.-N. Liu, National Central University Taiwan |
| 12:15 – 13:45 | Lunch Break |
| 13:45 – 15:55 | Session 6 |
| 13:45 – 14:15 | STMicroelectronics: AMS design flow – Trends, strategic tools and innovative methodologies for deep sub-micron technology nodes P. Daglio, STMicroelectronics Srl. |
| 14:15 – 14:45 | IMMS – Design and Optimization of a High-Speed Blu-ray Disc Photodetector IC with WiCkeD E. Hennig, IMMS GmbH |
| 14:45 – 15:15 | STMicroelectronics: WiCkeD – Statistical Analysis and Optimization of a Sense Amplifier for very low voltage applications in CMOS 90nm Flash technology from IMS MMS CR&D M. Micciche, A. Di Martino, STMicroelectronics Srl. |
| 15:15 – 15:45 | Ulm University for Applied Science: Investigations on Performance and Productivity Improvement of CMOS Circuits for Analog Signal Processing with WiCkeD F. Mrugalla, G. Vallant, G. Forster, University for Applied Science Ulm |
| 15:45 – 16:15 | Coffee & Discussion Break |
| 16:15 – 17:15 | Session 7 |
| 16:15 – 17:15 | Expert Session: WiCkeD – Tool Demos, Q&A & Feedbacks B. Lemaitre, M. Pronath, MunEDA GmbH |
| 17:15 – 17:30 | Wrap-up & Farewell |
Social Event
Hofbräukeller
Proceedings
Here you will find the password protected MUGM 2009 proceedings:
https://www.muneda.com/mugm/mugm-2009/proceedings/