Skip to content

MUGM 2019


We are pleased to invite you to the MunEDA Users Group Meeting 2019.

MUGM 2019 will take place on September 24th (Tue), 2019 in Munich, Germany. The goal of the event is an intensive exchange of knowledge by new and experienced industrial users. MUGM provides an open forum for engineers interested in MunEDA solutions for Custom IC Design Migration, Analysis, Modelling and Optimization.

September 24 – 09:00 a.m. to 04:00 p.m.

Maritim Hotel
Goethestraße 7
80336 Munich, Germany


Tuesday, 24th September, 2019

08:30 – 09:00Registration & Welcome Coffee
09:00 – 10:00Session 1: Opening & What’s new
MunEDA – Welcome & Whats new
A. Ripp, VP Sales & Marketing, MunEDA
STMicroelectronics – MUGM 2012 Chair Opening Remarks – Pierluigi Daglio
P. Daglio, STMicroelectronics – MUGM 2012 Conference Chair
MunEDA – What’s new in WiCkeD 7.2 and SPT 2.1 – Integration & R&D Roadmap
F. Schenkel, VP Research & Development, MunEDA
RWTH Aachen – Circuit Topology Migration of Sigma-Delta ADC (MeKoWA)
F. Speicher, RWTH Aachen
10:00 – 10:30Coffee Break
10:30 – 12:00Session 2: Analog IP Migration
MunEDA Tutorial – Tools and Methodologies for analog IP Migration between process technologies
M. Pronath, MunEDA
Fraunhofer – Intelligent IP: Fast Analog IC Design and Migration Using Generators
B. Prautsch, Fraunhofer
STMicroelectronics – Corner Verification and Design Optimization in Smart Power Technologies
P. Daglio, STMicroelectronics
ROHM – Effective analog circuit design using optimization tools
H. Kojima, ROHM
Inplay – Power Optimization for LO Buffers and PA+matching in a low-power SoC
R. Mohn, Inplay
MUGM Group Picture
All Participants
12:00 – 13:30Lunch Break
13:30 – 14:30Session 3: Circuit Sizing, Robustness, Yield and Reliability Optimization
MunEDA – Tutorial – New Feature Dependent Simulations for Trimming in WiCkeD7.2
C. Roma, MunEDA
CEITEC – Parametric Analysis Optimization MOSFET Macromodels ESD Circuit Simulation
R. Dettenborn, CEITEC
STMicroelectronics – Circuit Sizing & Robustness Optimization for Automotive Circuits
R. Pani, STMicroelectronics
Infineon – Migration and Optimization of RF Circuits with WiCkeD
S. Kerkmann, Infineon
RacyICs – Enabling ULV SoCs through ABBX
F. Schraut, RacyICs
14:30 – 15:00Coffee Break
15:00 – 16:00Session 4: Statistical, Monte-Carlo & High-Sigma Verification
MunEDA – Analog Verification with Monte Carlo, PVT Corners and Worst-Case Analysis
V. Glöckel, MunEDA
IMST – Migration, Sizing, Performance Optimization Flexible Data Converter IPs (MeKoWA)
R. Wittmann, IMST
STMicroelectronics – 40 nm Read-Path for NVM Analysis and Optimization
P. Coppa, STMicroelectronics
MunEDA – Wrap-up MUGM 2019 and Preparation for Oktoberfest Social Event
A. Ripp, MunEDA
From 16:00Social Event at Munich Oktoberfest
Social Event

Munich Oktoberfest – Ochsenbraterei


80333 Munich

directions: Google Maps


Here you will find the password protected MUGM 2019 proceedings:

To view the password protected MUGM Proceedings, send us a request

Data Privacy Policy *

I confirm my consent with the processing of my data and want to receive information and invites from MunEDA such as webinars, tradeshows, newsletter, MunEDA User Group Meeting, tool & solutions updates and other interesting information. To receive personalized news my preferences and behaviour can be analysed by MunEDA marketing. I know that I can revoke my approval at any time. Please find further important information and hints within our Data Privacy Policy.