We are pleased to invite you to the MunEDA Users Group Meeting 2006.
MUGM 2006 will take place on September 19th (Tue), 2006 in Munich, Germany. The goal of the event is an intensive exchange of knowledge by new and experienced industrial users. MUGM provides an open forum for engineers interested in MunEDA solutions for Custom IC Design Migration, Analysis, Modelling and Optimization.
September 19 – 10:00 a.m. to 04:00 p.m.
Hilton Munich City
Rosenheimer Straße 15
81667 Munich, Germany
Selection of Presentation Topics at MUGM 2006:
- 6T for Embedded SRAM – six sigma design
- Reuse of Circuit Topologies
- Design for Manufacturing (DFM) reference design flow
- Circuit Design for Yield (DFY) for a 110dB Op-Amp for Automotive and Sensor Applications