MUGM 2006

We are pleased to invite you to the MunEDA Users Group Meeting 2006.

MUGM 2006 will take place on September 19^th (Tue), 2006 in Munich, Germany. The goal of the event is an intensive exchange of knowledge by new and experienced industrial users. MUGM provides an open forum for engineers interested in MunEDA solutions for Custom IC Design Migration, Analysis, Modelling and Optimization.

Selection of Presentation Topics at MUGM 2006:

• 6T for Embedded SRAM – six sigma design
• Reuse of Circuit Topologies
• Design for Manufacturing (DFM) reference design flow
• Circuit Design for Yield (DFY) for a 110dB Op-Amp for Automotive and Sensor Applications

Tuesday, 19th September, 2006

09:30 – 10:00	Registration & Welcome Coffee
10:00 – 12:00	Session 1
10:00 – 10:30	MunEDA – Welcome & Whats new A. Ripp, VP Sales & Marketing, MunEDA
10:30 – 11:00	Analysis and optimization of a sense amplifier in 130 nm technology with WiCkeD C. Roma, STMicroelectronics
11:00 – 11:30	Reuse of Circuit Topologies using WiCkeD V. Boos, IMMS gGmbH
11:30 – 12:00	Technical Discussion
12:00 – 13:00	Lunch Break
13:00 – 14:15	Session 2
13:00 – 13:45	WiCkeDTM 5.0 – new features & functionalities M. Pronath, VP Products & Solutions, MunEDA GmbH
13:45 – 14:15	6T for Embedded SRAM – six sigma design with WiCkeD T. Fischer, Infineon AG
14:15 – 14:30	Coffee & Discussion Break
14:30 – 15:30	Session 3
14:30 – 15:00	Yield Optimization of a Power-on Reset Cell and Experimental Verification O. Eisenberger, austriamicrosystems AG
15:00 – 15:30	Circuit Design-for-Yield (DFY) for a 110 dB Op-Amp for Automotive and Sensor Applications U. Sobe, K.-H. Rooch, ZMD AG
15:30 – 16:00	Wrap-up, Discussion and Directions A. Ripp, VP Sales & Marketing, MunEDA GmbH
From 16:30	Social Event at Munich Oktoberfest

Munich Oktoberfest – Ochsenbraterei

Here you will find the password protected MUGM 2006 proceedings:

https://www.muneda.com/mugm/mugm-2006/proceedings/