Analog Circuit Verification Methodology
Abstract:
MunEDA’s software package WiCkeD™ is a tool suite for circuit analysis, sizing, and modeling at transistor level.
Papers & Publications
Analog Circuit Migration and Optimization from 28nm Bulk to 14nm FinFET Technology: A Case Study (SPT, WiCkeD)
Abstract:
Advanced process nodes utilize FinFET devices, for their improved performance and leakage power characteristics.
High sigma parametric yield estimation for SRAM and standard cells
Abstract:
Verification of SRAMand standard cells poses a specific challenge to the designer because the parametric yield estimation is to be estimated for very low failure rates below 1ppb (10 –9), equivalent to >6 sigma robustness.
Fast Monte Carlo Methods for Custom Circuit Analysis in MunEDA WiCkeD
Abstract:
Verification of custom circuit designs in sub-100nm technologies poses a specific challenge to the designer because simulation runtime can be long.
Innovative Design Methodology for Analog-to-Digital and Digital-to-Analog Converters
Abstract:
ADCs and DACs are vital in modern signal processing, connecting analog and digital domains. Growing demands make manual design a bottleneck; MeKoWA project aims to automate ADC and DAC design.
A Multi-level Analog IC Design Flow for Fast Performance Estimation Using Template-based Layout Generators and Structural Models
Authors:
B. Prautsch, T. Markwirth, R. Wittmann; F. Schenkel, U. Eichler, J. Liebig
Low Power Custom IC Design (Analog, RF) with MunEDA WiCkeD
Abstract:
The MunEDA WiCkeD tool set provides significant productivity gains over traditional design optimization methods, and enables advanced circuit architectures with lower power consumption and higher performance.
Automated Design Migration & IP Porting Flow for Custom Circuits
Abstract:
With the trend to go fabless, many chip designs have to be migrated between process technologies and within internal and external foundry processes.
Innovative Design Methodology for Analog-to-Digital and Digital-to-Analog Converters
Authors:
R. Wittmann; F. Henkel, A. Ripp, A, Meyer, R. Wunderlich, S. Heinen, M. Dietrich
AnastASICA – Towards Structured and Automated Analog/Mixed-Signal IC Design for Automotive Electronics
Authors:
B. Prautsch, H. Dornelas, R. Wittmann; F. Henkel, F. Schenkel, J. Koelsch, C. Grimm, G. Strube
Analysis and optimization of voltage reference circuits based on sub-1V MOSFETs operating in different CMOS technologies
Authors:
G. Quarata, M. Pronath
Porting an LDO architecture from 0.18 μm to 0.13 μm technology
Abstract:
Porting designs to new technology is common and involves schematic porting, sizing, and layout. Full custom design’s porting process consumes time, effort, and budget, with risks and uncertainties.
BTI induced dispersion: Challenges and opportunities for SRAM bit cell optimization
Authors:
F. Cacho, A. Cros, Y. Federspiel, V. Huard (STMicroelectronics), C. Roma (MunEDA)
Optimal NBTI Degradation and PVT Variation Resistant Device Sizing in a Full Adder Cell
Authors:
Z. Abbas, M. Olivieri, G. Strube, A. Ripp
New Technology Migration Methodology for Analog IC Design (using MunEDA SPT Schematic Porting Tool)
Authors:
H. Dornelas, A. Schmidt, E. Fabris, G. Strube