Audience:
Analog Design, Analog EDA
Duration:
00:41:33
Description:
Advanced semiconductor nanometer technology nodes, together with smart IC design applications, enable very complex and powerful systems for communication, automotive, data transmission, AI, IoT, medical, industry, energy harvesting, and many more. However, more aggressive time-to-market and higher performance requirements force IC designers to look for advanced and seamless design flows, tools & methodologies to overcome these challenges. In this context for high-precision circuit applications, quality trimming is becoming a very important step before tape-out because the increased performance variation induced by process statistics cannot be reduced only at the design level.
Most of today’s trimming applications are based on Monte Carlo Analysis to ensure that a trimming step is executed for each simulation sample. Unfortunately, this task often requires custom scripts to setup the right sequence of multiple simulations and cannot be reliable for high-sigma robustness application (beyond 3 sigma) at long tail distributions.
MunEDA provides an enhanced Dependent Test Feature for circuit trimming within its EDA design tool suite WiCkeD. This ensures for each simulation sample an easy-to-use and seamless trimming procedure as well as controlled switching of operating conditions, suitable for circuit verification, high-sigma robustness and circuit sizing/optimization.
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