Webinar – Fast and Accurate High-Sigma Analysis with Worst-Case Points

Audience:
Analog Design, Analog EDA

Duration:
01:00:00

Description:
IC designers are tasked with meeting specifications like robustness in SRAM bit cells where the probability of a violation are lower than 1 part-per-billion (1 ppb). Another example of robustness is a Flip-Flop register that must have a probability of specification violation lower than 1 part-per-million (1 ppm). Using Monte Carlo simulation at the SPICE level for normal distributed performance with a small sample size to achieve 1 ppm requires 4.75 sigma analysis, while reaching 1 ppb increases to 6.0 sigma analysis. The problem is that for non-normal distributed performance the standard Monte Carlo approach requires a sample size that is simply too large to simulate, so a more efficient approach is required and that’s where high-sigma analysis and worst-case points come into use.

Register for this MunEDA webinar scheduled for November 14th at 9AM PST,
and be prepared to have your questions answered by the experts.

MunEDA provides the necessary features for post-layout circuit optimization within its EDA design tool suite WiCkeD. Design engineers load circuit schematics together with DSPF post-layout netlists into MunEDA WiCkeD, parameterize the circuit interactively, and use MunEDA’s circuit optimization tools to improve the circuit performance by incremental changes of geometries, simulating the DPSF post-layout netlists. The final results are back-annotated into the schematic database to update the layout. In this webinar we’ll discuss post-layout optimization, and will show how to set up and run a test case in MunEDA’s WiCkeD circuit sizing & verification tool suite.