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Michael Pronath

Yield-optimization of CMOS full-adder design with PVT variations and NBTI

We present the detailed results of the application of mathematical optimization algorithms to transistor sizing in a full-adder cell design, to obtain the maximum expected fabrication yield. The approach takes into account all the fabrication process parameter variations specified in an industrial PDK, in addition… Read More »Yield-optimization of CMOS full-adder design with PVT variations and NBTI

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