Publications & Technical Papers


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Oct
31st
2007
HONEY – Highly Optimized Design Methods for Yield and Reliability
STMicroelectronics - Infineon - X-FAB - MunEDA - IMMS
MEDEA+ Annual Forum 2007, October 2007, Budapest, Hungary
May
31st
2007
An IP Porting System for Analog Libraries
Faraday Technology Corporation
May 2007, Hsin-Chu/Munich, Taiwan/Germany
May
31st
2007
65nm Technology Based Modelling and Analysis Methodologies based on Variations
Infineon - Fraunhofer - MunEDA - Sigma65
May 2007, Hannover, Germany
Apr
30th
2007
Challenges of reliability oriented design strategies for analog and mixed-signal circuits
MunEDA GmbH, Munich, Germany
MEDEA-DAC 2007, April 2007, Grenoble, France
Apr
30th
2007
Graph Theoretical Approach for Initial Sizing of Analog Circuits
IMMS GmbH, Erfurt, Germany
DASS 2007, April 2007, Dresden, Germany
Mar
31st
2007
Analog Design Centering and Sizing
Technical University Munich, Germany
March 2007, Munich, Germany
Feb
28th
2007
Design Tutorial DfY-DfM - Design for Yield and Manufacturability
MunEDA GmbH, Munich, Germany
IMMS - TU Ilmenau

ZuD 2007 - Reliability and Design, February 2007, Munich, Germany
Feb
28th
2007
Robust Analog Design for Automotive Applications by Design Centering
ZMD AG, Dresden, Germany
MunEDA GmbH, Munich, Germany

ZuD 2007 - Reliability and Design, February 2007, Munich, Germany