MunEDA User Group Meetings



MUGM MunEDA User Group Meeting 2017, Nov 07th / Nov 08th - Presentations


 
STMicroelectronics - MUGM 2017 Chair Opening Remarks
Presenter: P. Daglio
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Empyrean / ICScape - Verification for Silicon Success
Presenter: J. Xing / KC Chen
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MunEDA Tutorial - (New Tool) Circuit Migration with New GUI-Version SPT 2.0
Presenter: D. Plant
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SMIC - Usage of WiCkeD in SMIC's Flash Applications
Presenter: YJ Kwon
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STMicroelectronics - Design optimization and Retargeting Strategies of Standard Cells with WiCkeD in 28nm FDSOI Technology
Presenter: N. Ben Salem
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X-FAB – Your More-Than-Moore foundry partner
Presenter: M. Wilhelm
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MunEDA Tutorial - Worst Case Analysis Methodology with WiCkeD
Presenter: M. Pronath
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Infineon - High Sigma Verification of SRAM cells
Presenter: P. Huber / S. Schumann / W. Kamp / P. Micus
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Infineon - RESIST RESilient Integrated SysTems (EU CATRENE Project RESIST)
Presenter: K. Puscharsky / G. Georgakos
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TUM - Munich Technical University - Power-Down Synthesis for Analog Circuits
Presenter: M. Neuner
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MunEDA Tutorial - Low-Power Circuit Sizing for Custom IC
Presenter: D. Plant
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Robert Bosch / University Reutlingen - A Generic Topology Selection Method of Analog Circuits with Embedded Circuit Sizing Demonstrated on OTA Example
Presenter: A. Gerlach
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STMicroelectronics - Read Path Optimization for 40nm Technology
Presenter: P. Coppa
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Novatek - Optimization and Evaluation of Interface Circuits with WiCkeD
Presenter: CP Huang
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MunEDA Tutorial - SRAM Hierarchical Read Failure Analysis
Presenter: M. Pronath
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SKHynix - Fail analysis of Digital Temperature Sensors with WiCkeD in Non-Volatile Memory
Presenter: C. Seungwan / S. Choi
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LinkGlobal21 - Optic Simulation Solutions in High End Devices
Presenter: J. Park / D. Kang
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TUM - Munich Technical University - Robustness Optimization for MEMS-IC Systems
Presenter: F. Burcea
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MunEDA Tutorial - Flip-Flop High-Sigma Robustness Verification and Sizing with WiCkeD
Presenter: C. Roma
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Jena University - Optimization of a Low-power Fully Differential OTA with WiCkeD and an Introduction to Modelling the Performance Space of Front-ends for Thermoelectric Sensor Arrays
Presenter: D. Schreiber
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Chipus Microelectronics S.A. - Robustness verification for trimmed references
Presenter: M. Pesatti
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CTI - Circuit Analysis and Optimization of Voltage Reference
Presenter: J.E.V. Solano
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