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MTF Japan 2012 - MunEDA Technical Forum
Major Topics
- Design analysis, modeling and optimization
- IP Porting & Technology Migration
- High-Sigma Yield Analysis & Optimization
- Analog Circuit Verification
- Design Centering for High-End Technology generation in deep-submicron
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| Friday, 18th May, 2012 - Room F |
| 12:00 - 12:30 |
Set up |
| 12:30 - 13:00 |
Registration & welcome coffee |
| 13:00 - 15:10 |
Technical Session D1.1 |
| 13:00 |
Introduction & WiCkeD Outline
M. Shoji, NCS Corporation, Japan |
| 13:10 |
What´s New?
M. Pronath, MunEDA GmbH, Germany |
| 13:35 |
NEW: Agilent GoldenGate & MunEDA WiCkeD integration
T. Kikuchi, Agilent, Japan
A. Ripp, MunEDA GmbH, Germany |
| 13:40 |
Business Trends in the Japanese Semiconductor and EDA markets
M. Nakamae, IPN Corporation, Japan |
| 14:10 |
Numerical Sizing for Full-Custom Design
K. Tsutsumi, NCS Corporation, Japan |
| 14:40 |
(Invited Talk) STARCAD-AMS: Analog IP re-use design flow
K. Tsuboi, STARC, Japan |
| 15:10 - 15:30 |
Coffee & Discussion Break |
| 15:30 - 18:00 |
Technical Session D1.2 |
| 15:30 |
Statistical Verification for Full-Custom Design
K. Tsutsumi, NCS Corporation, Japan |
| 15:50 |
(Invited Talk) PLL Loop optimization by WiCkeD
M. Kaneko, Toshiba Semiconductor & Storage Products Company, Japan |
| 16:20 |
(Invited Talk) Analog Design Optimization with gm/ID Lookup Table Method and WiCkeD
S. Masui, Fujitsu Laboratories Ltd., Japan |
| 16:50 |
Software Demonstration
M. Pronath, MunEDA GmbH, Germany |
| 17:20 |
Survey
M. Shoji, NCS Corporation, Japan |
| 17:30 |
Conference End & After Discussion |
| 18:00 - 18:30 |
Clean up |
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In friendly cooperation with our MunEDA Japan distributors
NCS Nippon-Control-Systems Japan: www.nippon-control-system.co.jp/en
IPN International Professional Networks: www.ipncorp.com
More information coming soon.
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WebEx
