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Download the full conference Proceedings (9,8 MB) |
| MUGM Europe 2008 Presentations |
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Considering parameter variations in IC design optimization: Pareto-front calculation and other ideas
U. Schlichtmann, Technical University of Munich
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Designflow Integration into UNICAD and selected industrial WiCkeDTM application cases
P. Daglio, NVM Mixed-Signal Design Flow Program Manager, STMicroelectronics
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WiCkeDTM 6.0 - Software Tutorial
M. Pronath, VP Products & Solutions, MunEDA GmbH
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WiCkeDTM 6.0 Modelling - Industrial application cases
E. Raciti, CAD Engineer, STMicroelectronics
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Integration of DFY into Infineon´s Front-end Analog Communication Designflow
P. Rotter, Infineon Technologies AG
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Sigma65 - Digital Timing and Power Simulation with Statistical Process Variations
J. Haase, Fraunhofer IIS EAS
U. Eichler, Fraunhofer IIS EAS
H. Häner, Infineon Technologies AG
R. Häußler, Infineon Technologies AG
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High Reliable Design for High-Performance Analog Circuits
U. Sobe, ZMD AG
K.-H. Rooch, ZMD AG
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Using WiCkeDTM for Solving Discrete Optimization Problems in BiCMOS Design
V. Boos, IMMS gGmbH / X-FAB
B. Dimov, TU Ilmenau / IMMS gGbmH
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Circuit Analysis and Yield Optimization for critical Analog Blocks in Non Volatile Memories Application
M. Micciche, STMicroelectronics / MMS-CR&D
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WiCkeD Release Updates and MunEDA R&D-Roadmap
F. Schenkel, VP Research & Development, MunEDA GmbH
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Yield Enhancement Techniques for Deep-Submicron Technologies
B. Lemaitre, Infineon Technologies AG
O. Rizzo, Infineon Technologies AG
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Design Analysis and Optimisation of Automotive Sensor Circuits
M. Barth, Robert Bosch GmbH
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IP porting & Analog Synthesis Automation Platform using WiCkeDTM
W. Woei-Tzy Jong (鐘偉滋), Faraday Technology Corp.
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Statistical Modeling and Simulation in Automotive Power Circuit Development
K.-W. Pieper, Infineon Technologies AG
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Circuit Design Optimization Cases for Wireless Cellular Communication
D. Chollat-Namy, ST-NXP Wireless
C. Vaganay, ST-NXP Wireless
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Integration of WiCkeDTM into Mentor Graphics Custom IC Flow with ICstudioTM, DesignArchitect®-ICTM and Eldo®
C. Parg, Mentor Graphics®
V. Glöckel, MunEDA GmbH
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Statistical effects of NBTI degradation in SRAM cells
T. Fischer, Institute for Technical Electronics, Technical University of Munich / Infineon Technologies AG
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