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WCD - Worst Case Diagnosis
WCD enables the designers to interactively improve and optimize the robustness for their designs. MunEDA’s unique silicon proven Worst Case Distance methodology also enables the interactive optimization for yield.
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Typical Questions & Answers
Typical questions answered by Worst-Case Diagnosis are:
- By how much must the channel width of a given transistor be increased in order to get a worst-case distance (robustness) of a particular performance?
- How will the other worst-case distances (robustnesses) change, if the channel width is increased by a specific amount? (Change Design Parameters)
- Which worst-case distances can be adjusted independently from each other, and which performances show trade-offs? (WCD Dependency)
- Which design parameters have similar influences on the worst-case distances and are therefore redundant? (Parameter Redundancy)
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