|
WCD - Worst Case Diagnosis
WCD enables the designers to interactively improve and optimize the robustness for their designs. MunEDA’s unique silicon proven Worst Case Distance methodology also enables the interactive optimization for yield.
|
 |
|
|
Overview
Feature Examples contain:
- Specification driven design
- Parametric Yield Analysis
- Interactive Yield Improvement
- Contributor Diagnosis
- Worst Case Distance Algorithms
- Design Parameter Influence
|
 |
|
|
