Design for Manufacturability & Design for Yield
HomeProductsApplication AreasE-LearningCustomersPartnersNewsEventsUser Group MeetingsCompanyContact & DistributorsWebEx
Schematic Porting Tools »

Nominal Circuit Analysis Tools »

Nominal Circuit Optimization Tools »

Statistical Circuit Analysis Tools »

Statistical Circuit Optimization Tools »

IP Porting Solutions »

Circuit Model Generation Tools »

Simulation & Designframework Interfaces »

List & Configure all Tools »

Download Product Sheet »
WCD - Worst Case Diagnosis

WCD enables the designers to interactively improve and optimize the robustness for their designs. MunEDA’s unique silicon proven Worst Case Distance methodology also enables the interactive optimization for yield.
Overview GUI Reference Typical Questions & Answers Application & Benefits
Overview

Feature Examples contain:
  • Specification driven design
  • Parametric Yield Analysis
  • Interactive Yield Improvement
  • Contributor Diagnosis
  • Worst Case Distance Algorithms
  • Design Parameter Influence