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MunEDA – WiCkeDTM Statistical Circuit Analysis Tools
MunEDA WiCkeD Statistical Circuit Analysis Tools contain numerous methodologies to analyze and diagnose statistical effects of process variations have against integrated circuits regarding their functionality, topology concepts, performances, behavior against statistical variation effects. Statistical means here the circuit behavior based on global and local (mismatch) statistical variations. MunEDA offers within the WiCkeD suite numerous tools and methodologies for intensive Statistical Circuit and Variation Analysis for many application areas. These can support the circuit designer to reduce design time and effort and come up with high-performing and well-behaved circuits in an easy and convenient way.
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MCA - Monte Carlo Analysis
MCA is one of the most powerful Monte Carlo Analysis tools on the market. Containing numerous tools and features for parametric yield analysis, contributors for yield loss can be detected and eliminated.
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- Parametric Yield Analysis
- Mismatch Analysis
- Influence Analysis of Process Variations
- Contributor Analysis
- Performance distributions
- Means, standard deviations, correlations
- Margin distributions
- Global process information
- Local process information (Matching)
- Scatter plots
- Data export
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- Variation-aware design analysis
- Variation Design Analysis
- Parametric Yield Analysis
- Mismatch Analysis
- Calculation of standard deviations
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WCA - Worst Case Analysis
With WCA the circuit designer is able to estimate the worst-case conditions for individual performance specifications. It determines partial and total yields for given specifications on circuit performances.
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- Total yield estimation
- Partial yield estimation
- Consideration of operating conditions
- Consideration of process parameters
- Global process variations
- Local process variations (Mismatch)
- Sensitivity-Based Algorithms
- Evolutionary/Genetic Algorithms
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- Variation-aware design analysis
- High-Yield Design Analysis
- Mismatch Analysis
- Partial and total yields for given specifications on circuit performance
- Worst Case Analysis
- Robustness Analysis
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WCD - Worst Case Diagnosis
WCD enables the designers to interactively improve and optimize the robustness for their designs. MunEDA´s unique silicon proven Worst Case Distance methodology also enables the interactive optimization for yield.
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- Specification driven design
- Parametric Yield Analysis
- Interactive Yield Improvement
- Contributor Diagnosis
- Worst Case Distance Algorithms
- Design Parameter Influence
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- Variation-aware design analysis
- Manual adjustment of a design with consideration of process variations
- Manual design centering
- Analysis of Worst-Case Analysis results
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MMA - Deterministic Mismatch Analysis
MMA identifies and analyses mismatch-relevant transistor pairs on selected circuit performances. The variance of these local variations will be analyzed based on dependencies of device pair geometries.
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- Mismatch pair detection
- Analysis of matching constraints
- Local process variations influence
- Information for yield optimization
- Fast deterministic algorithms
- Performances by mismatch effects
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- Variation-aware design analysis
- Mismatch Analysis
- Matching Analysis
- Reliability Analysis
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