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MunEDA – WiCkeDTM Statistical Circuit & Yield Optimization Tools
MunEDA WiCkeD Statistical Circuit Optimization Tools contain powerful algorithms to center the designer’s circuits regarding statistical effects of process variations to size and optimize their functionality, topology concepts, performances, behavior against statistical variation effects. Statistical means here the circuit behavior based on global and local (mismatch) statistical variations. MunEDA offers within the WiCkeD suite numerous tools and methodologies for intensive Statistical Circuit and Yield Optimization for many application areas. These can support the circuit designer to reduce design time and effort and come up with high-performing and well-behaved circuits in an easy and convenient way.
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YOP - Yield Optimization
YOP is the world´s unique and most powerful tool for automatic performance and yield optimization based on global and local process parameter variations. Active optimization of 6 sigma robustness levels and more are now possible.
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- Automatic Yield Optimization
- 6+ sigma design optimization
- Consideration of operating conditions
- High efficient optimization engines
- Low simulation effort compared to Monte Carlo or Stochastic algorithms
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- Variation-aware design optimization
- Design Centering
- Yield Optimization
- Robustness Optimization
- Reliability Optimization
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