Design for Manufacturability & Design for Yield
HomeProductsApplication AreasE-LearningCustomersPartnersNewsEventsUser Group MeetingsCompanyContact & DistributorsWebEx
Schematic Porting Tools »

Nominal Circuit Analysis Tools »

Nominal Circuit Optimization Tools »

Statistical Circuit Analysis Tools »

Statistical Circuit Optimization Tools »

IP Porting Solutions »

Circuit Model Generation Tools »

Simulation & Designframework Interfaces »

List & Configure all Tools »

Download Product Sheet »
MMA - Deterministic Mismatch Analysis

MMA identifies and analyses mismatch-relevant transistor pairs on selected circuit performances. The variance of these local variations will be analyzed based on dependencies of device pair geometries.
Overview Deterministic Mismatch Analysis Workflow
Overview

Feature Examples contain:
  • Mismatch pair detection
  • Analysis of matching constraints
  • Local process variations influence
  • Information for yield optimization
  • Fast deterministic algorithms
  • Performances by mismatch effects