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X-Fab

X-FAB is the world’s largest analog/mixed-signal foundry group manufacturing silicon wafers for mixed-signal integrated circuits (ICs). Its marketing network and client base span the Americas, Europe and Asia, offering manufacturing capacity of approximately 744,000 200mm-equivalent wafers per year. X-FAB customers benefit from high-performance technologies, excellent technical design and prototyping services; and fast, easy and flexible foundry access worldwide. Privately held and headquartered in Erfurt, Germany, X-FAB has sustained steady growth year over year, often exceeding that of the industry at large. It currently employs approximately 2,500 people worldwide. X-Fab and MunEDA


X-Fab-MunEDA longlasting partnership

X-Fab and MunEDA have established an official EDA and foundry cooperation since 2007 to support their mutual customers with best-in-class solutions in their respective fields and technologies. MunEDA software tools are available and configured for most of the X-Fab technologies and pdk from 1µm down to 180nm.


X-Fab-MunEDA Reference Flow Description
  • WWW[Link] X-Fab EDA Partner Page Overview
  • WWW[Link] X-Fab EDA Partner Page MunEDA
  • PDF[Link] Technology Setup for WiCkeD in X-FAB CMOS and BiCMOS Process for Automotive and Sensor Applications

X-Fab-MunEDAPublications & Customer Reference Cases
  • WWW[Link] SCD 2009 - Verification Method for Analog and Mixed Circuits Considering Performance Parameters and Safe Operating Area (SOA) Constraints
  • PDF[Link] ZMD/X-Fab/MunEDA - Verification of Safe Operating Area (SOA) Constraints in Analog Circuits
  • PDF[Link] IMMS Design and Optimization of a High-Speed Blu-ray Disc Photodetector IC with WiCkeD in X-FAB 0.6 µm BiCMOS process
  • PDF[Link] EUROPEAN NANOELECTRONICS Forum 2008 - STMicroelectronics/Infineon/X-Fab/MunEDA/IMMS: HONEY - Highly Optimized Design Methods for Yield and Reliability 2A713
  • PDF[Link] ZMD - High Reliable Design for High-Performance Analog Circuits in X-Fab 0,35nm technology
  • PDF[Link] IMMS Analysis of frequency-optimized transimpedance amplifiers in XFAB 600nm BiCMOS technology
  • PDF[Link] ZuE2008 - (Best Paper Award) ZMD, X-Fab, MunEDA Verification of Safe Operating Area (SOA) Constraints in Analog Circuits

X-Fab-MunEDAIndustrial Cooperations & Funding Projects
  • PDF[Link] Edacentrum Newsletter 03/2009: HONEY - Grundlagen für die Analyse und Optimierung von Ausbeute und Zuverlässigkeit Integrierter Schaltungen
  • PDF[Link] MEDEA+ Annual Forum 2007 - HONEY - Highly Optimized Design Methods for Yield and Reliability

X-Fab-MunEDA MUGM MunEDA User Group Meeting Contributions
  • PDF[Link]*MUGM 2009 - IMMS Analysis of frequency-optimized transimpedance amplifiers in XFAB 600nm BiCMOS technology
  • PDF[Link]*MUGM 2009 - IMMS Design and Optimization of a High-Speed Blu-ray Disc Photodetector IC with WiCkeD in X-FAB 0.6 µm BiCMOS process
  • PDF[Link]*MUGM 2008 - ZMD - High Reliable Design for High-Performance Analog Circuits in X-Fab 0,35nm technology
  • PDF[Link]*MUGM 2007 - Technology Setup for WiCkeD in X-FAB CMOS and BiCMOS Process for Automotive and Sensor Applications
  • PDF[Link]*(German) MUGM 2004 Workshop Design Centering: IMMS/Melexis/X-Fab/Infineon/Cadence/MunEDA - Design Efficiency and Yield Improvement in Analog Design with WiCkeD
*Downloads of MUGM-contributions are password protected. In case of interest please contact us.


X-Fab-MunEDA Weblinks & Press Releases
  • WWW[Link] 2007 Nov - X-Fab & MunEDA joint press release: X-FAB Adds Support for MunEDA WiCkeD Tool Family to Statistical Modeling Offering to Optimize Circuit Performance, Statistical Analysis, Yield Optimization
  • WWW[Link] (Deutsch) 2007 Nov - X-Fab & MunEDA joint press release: X-FAB’s Angebot für statistische Modellierung unterstützt ab sofort MunEDA’s Software-Familie WiCkeD zur statistischen Analyse und Ausbeuteoptimierung

X-Fab-MunEDA Testimonial

Thomas Ramsch, director of design support at X-FAB:
"Designing mixed-signal ICs is challenging and complex. We are pleased to add MunEDA´s methodologies for circuit performance, statistical analysis and yield optimization to our full statistical modeling support. This powerful software helps our customers make their analog/mixed-signal designs more robust and get to market faster."