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ZMD and MunEDA awarded for Best Paper Award 2007 at ZuE Conference 2008 in Ingolstadt
Ingolstadt, Germany - Friday, September 19th, 2008
Ceremony at ZuE 2008 for Best Paoer of ZuE 2007
ZMD and MunEDA have received the Best Paper Award from ZuE Zuverlässigkeit und Entwurf (Reliability & Design) Conference for their paper contribution at ZuE 2007 that was selected by the committee for the best paper award. The contribution is about "Robust Analog Design for Automotive Applications by Design Centering". Authors are Karl-Heinz Rooch and Dr. Udo Sobe from ZMD AG, Dresden, Germany as well as Dr. Michael Pronath from MunEDA GmbH, Munich Germany.
The award was supplemented to the winners in a ceremony at ZuE2008 in Ingolstadt by the ZuE committee Dr. Sebastian Sattler and Prof. Dr. Hans-Joachim Wunderlich.
MunEDA is also co-sponsor of the ZuE2008 in Ingolstadt.
About MunEDA
Founded in 2001, MunEDA provides leading EDA technology for analysis and optimization of yield and performance of analog, mixed-signal and digital designs. MunEDA´s products and solutions enable customers to reduce the design times of their circuits and to maximize robustness and yield. MunEDA´s solutions are in industrial use by leading semiconductor companies in the areas of communication, computer, memories, automotive, and consumer electronics. WiCkeDTM is a comprehensive and powerful software tool suite for manual, semi- and full automatic analysis and yield optimization of analog, mixed signal and digital circuits. MunEDA has offices in Munich, Germany (Headquarter) and Sunnyvale, California, USA (MunEDA Inc.). MunEDA is represented by leading EDA distribution companies worldwide in USA, Japan, Korea, Taiwan, Singapore, Malaysia, Scandinavia, and others. Please refer to www.muneda.com/contact
For further information please contact:
MunEDA Marketing
Ben Grasenack
+49-89-93086-347
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