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| Agenda MunEDA User-Group-Meeting Europe 2008 |
| 09th October |
| 10.30 - 11.00 |
Registration & Welcome Coffee |
| 11.00 - 11.15 |
Welcome & Whats new
A. Ripp, VP Sales & Marketing, MunEDA GmbH |
| 11.15 - 12.00 |
KEYNOTE: Considering parameter variations in IC design optimization: Pareto-front calculation and other ideas
U. Schlichtmann, Technical University of Munich |
| 12.00 - 13.00 |
Lunch Break |
| 13.00 - 13.30 |
STMicroelectronics: Designflow Integration into UNICAD and selected industrial WiCkeDTM application cases
P. Daglio, NVM Mixed-Signal Design Flow Program Manager, STMicroelectronics |
| 13.30 - 14.10 |
WiCkeDTM 6.0 - Software Tutorial
M. Pronath, VP Products & Solutions, MunEDA GmbH |
| 14.10 - 14.20 |
Coffee & Discussion Break |
| 14.20 - 14.50 |
STMicroelectronics: WiCkeDTM 6.0 Modelling - Industrial application cases
E. Raciti, CAD Engineer, STMicroelectronics |
| 14.50 - 15.20 |
Infineon: Integration of DFY into Infineonīs Front-end Analog Communication Designflow
P. Rotter, Infineon Technologies AG |
| 15.20 - 15.50 |
Fraunhofer EAS: Sigma65 - Digital Timing and Power Simulation with Statistical Process Variations
J. Haase, Fraunhofer IIS EAS
U. Eichler, Fraunhofer IIS EAS
H. Häner, Infineon Technologies AG
R. Häußler, Infineon Technologies AG |
| 15.50 - 16.10 |
Coffee & Discussion Break |
| 16.10 - 16.40 |
ZMD: High Reliable Design for High-Performance Analog Circuits
U. Sobe, ZMD AG
K.-H. Rooch, ZMD AG |
| 16.40 - 17.10 |
Using WiCkeDTM for Solving Discrete Optimization Problems in BiCMOS Design
V. Boos, IMMS gGmbH / X-Fab
B. Dimov, TU Ilmenau / IMMS gGbmH |
| 17.10 - 17.40 |
STMicroelectronics: Circuit Analysis and Yield Optimization for critical Analog Blocks in Non Volatile Memories Application
M. Micciche, STMicroelectronics / MMS-CR&D |
| 17.40 - 18.00 |
Wrap-up Discussion DAY 1
A. Ripp, VP Sales & Marketing, MunEDA GmbH |
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| From 19.30 |
Social Event
See also Social Event |
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| 10th October |
| 09.00 - 10.00 |
Speakers Breakfast |
| 10.00 - 10.20 |
WiCkeD Release Updates and MunEDA R&D-Roadmap
F. Schenkel, VP Research & Development, MunEDA GmbH |
| 10.20 - 10.45 |
Infineon: Yield Enhancement Techniques for Deep-Submicron Technologies
B. Lemaitre, Infineon Technologies AG
O. Rizzo, Infineon Technologies AG |
| 10.45 - 11.10 |
Bosch: Design Analysis and Optimisation of Automotive Sensor Circuits
M. Barth, Robert Bosch GmbH |
| 11.10 - 11.30 |
Coffee & Discussion Break |
| 11.30 - 11.55 |
Faraday Technology Corp.: IP porting & Analog Synthesis Automation Platform using WiCkeDTM
W. Woei-Tzy Jong (鐘偉滋), Faraday Technology Corp. |
| 11.55 - 12.20 |
Infineon: Statistical Modeling and Simulation in Automotive Power Circuit Development
K.-W. Pieper, Infineon Technologies AG |
| 12.20 - 12.50 |
ST-NXP Wireless: Circuit Design Optimization Cases for Wireless Cellular Communication
D. Chollat-Namy, ST-NXP Wireless
C. Vaganay, ST-NXP Wireless |
| 12.50 - 13.30 |
Lunch Break |
| 13.30 - 14.00 |
Mentor Graphics® / MunEDA - Integration of WiCkeDTM into Mentor Graphics Custom IC Flow with ICstudioTM, DesignArchitect®-ICTM and Eldo®
C. Parg, Mentor Graphics
V. Glöckel, MunEDA GmbH |
| 14.00 - 14.20 |
LTE / Infineon: Statistical effects of NBTI degradation in SRAM cells
T. Fischer, Institute for Technical Electronics, Technical University of Munich / Infineon Technologies AG |
| 14.20 - 14.40 |
Wrap-up Discussion DAY 2 and End of Conference
A. Ripp, VP Sales & Marketing, MunEDA GmbH |
| 14.40 - 15.00 |
Farewell Coffee & Discussion |
| Following |
Munich Sightseeing & Beer Garden Event |
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