Design for Manufacturability & Design for Yield
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Overview Program Local Information Proceedings Internal
Agenda MunEDA Technical-Forum Taiwan 2008
08.45 - 09.10 Registration & Welcome Coffee
09.10 - 09.15 Welcome & Introduction
Chin-Lung King (金清隆), GTI Grand Technology, Inc.
09.15 - 09.45 Robust Design Methodologies for Deep Submicron Technologies
Prof. Dr. Mi-Chang Chang (張彌彰), National Tsing Hua University
09.45 - 10.15 Circuit Design for Yield with MunEDA WiCkeD
M. Pronath, VP Products & Solutions, MunEDA GmbH
10.15 - 10.30 Coffee & Discussion Break
10.30 - 11.00 WiCkeD Software Demonstration
Simon Hong (洪瑞華), GTI Grand Technology, Inc.
11.00 - 11.30 FARADAY: Analog Design Synthesis Platform with WiCkeD
David Chang-Chung Wu (吳章昌), Faraday Technology Corporation
11.30 - 12.00 Industrial WiCkeD DFM-DFY Application Cases
M. Pronath, VP Products & Solutions, MunEDA GmbH
12.00 - 12.15 General Discussion, Question & Answer
May Chen (陳巧美), GTI Grand Technology, Inc.
12.15 Lunch & Talks