Design for Manufacturability & Design for Yield
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Proceedings »
Overview Program Local Information Internal
Date: Thursday, January 28th, 2009

Time: 12:30 - 13:30

Program and Name of lecturer:
  • Company Information:
    Kanji Saruta, CEO & President, IPN Corporation
    Andreas Ripp, VP Sales & Marketing, MunEDA
  • WiCkeD introduction:
    Hiroshi Fuji, Software Design Engineering Manager, NCS Nippon Control Systems
    Kenji Tsutsumi, NCS Nippon Control Systems
  • Discuss, Q&A: Matthias Sylvester, Technical Account Manager, MunEDA

Session introduction:
Target of the session is an introduction into MunEDA´s WiCkeD tool suite for analysis, modelling and optimization of analog, mixed-signal and digital circuits for performance and yield. MunEDA´s solutions are in industrial use by leading semiconductor companies in the areas of communication, computer, memories, automotive, and consumer electronics. After a general introduction into methodology and customer reference cases there will be a short tool demo and tutorial.

Language: Japanese