MunEDA GmbH - MUGM-MTF-MTS » Europe 2009

Agenda MunEDA User-Group-Meeting Europe 2009

12th November
09.30 - 10.30	Registration & Welcome Coffee
10.30 - 10.45	Welcome & Whats new A. Ripp, VP Sales & Marketing, MunEDA GmbH
10.45 - 11.30	KEYNOTE - STARC - Tools, Trends & Strategic Challenges for the Global Semiconductor Industry K. Tsuboi, Semiconductor Technology Academic Research Center, Yokohama, Japan
11.30 - 12.00	STMicroelectronics: Worst Case Analysis and Yield Optimizationof a micro-power precision OpAmp based on an advanced Offset Cancellation Chopper technique in HF7CMOS (350nm) from APM-IMS with WiCkeD A. Ciccazzo, STMicroelectronics Srl. / MMS-CR&D, Catania, Italy
12.00 - 13.30	Lunch Break
13.30 - 13.55	IPGEN: Automatic Analog IP Generation with: 1Stone^® D. Friebel, IPGEN GmbH, Germany
13.55 - 14.20	STMicroelectronics - WiCkeD Application Case: Design and characterization of a dither VCO for mixed signal application at different levels of abstraction A. Colaci, STMicroelectronics Srl., Automotive Products Group, Castelletto - Cornaredo, Italy
14.20 - 15.05	MunEDA: WiCkeD^TM 6.0 - Software Tutorial & Release Updates B. Obermeier, MunEDA GmbH, Munich, Germany
15.05 - 15.30	BOSCH - Methods of Usage Measurement for WiCkeD in Bosch Automotive Design Flow M. Barth, Robert Bosch GmbH, Reutlingen, Germany
15.30 - 16.00	Coffee & Discussion Break
16.00 - 16.30	LANTIQ: The Stepchild Parametric Yield G. E. Müller-L., Lantiq GmbH, Neubiberg, Germany
16.30 - 17.00	ATMEL: Modelling of Multi-Stage Amplifiers with WiCkeD W. Schneider, H.-W. Groh, S. Kern, Atmel Germany GmbH
17.00 - 17.30	Infineon: Architectural Assessment of Design Techniques to Improve Speed and Robustness in Embedded Microprocessor T. Baumann, Infineon Technologies AG, Munich, Germany
17.30 - 18.00	IMMS: Analysis of frequency-optimized transimpedance amplifiers in XFAB 600nm BiCMOS technology D. Krauße, TU-Ilmenau/IMMS GmbH
From 19.00	Social Event See also Social Event

13th November
09.00 - 09.30	MunEDA Tools and R&D-Roadmap F. Schenkel, VP Research & Development, MunEDA GmbH
09.30 - 10.00	STMicroelectronics: WiCkeD simulation based and modeling approach. Ring oscillator in 65nm non volatile memory technology from TRD-CCDS and low emission I/O pad buffer in 90nm CMOS low power technology from APG Car Radio. E. Raciti, Central R&D, STMicroelectronics Srl., Agrate, Italy
10.00 - 10.30	TUM Technische Universität München - Towards Reliability Optimization of Analog Integrated Circuits H. Gräb, Technische Universität München, Germany
10.30 - 11.00	Coffee & Discussion Break
11.00 - 11.25	HYNIX - Using WiCkeD in DRAM Development K.-S. Kim, Hynix Semiconductors Inc., Korea
11.25 - 11.50	ZMDI: Analog IP Porting E. Böhme, ZMD AG, Dresden, Germany
11.50 - 12.15	NCU National Central University Taiwan - Analog Behavioral Modeling and Its Application on Yield Enhancement of Analog Circuits C.-N. Liu, National Central University Taiwan, Jung-Li, Taiwan, R.O.C.
12.15 - 13.45	Lunch Break
13.45 - 14.15	STMicroelectronics: AMS design flow - Trends, strategic tools and innovative methodologies for deep sub-micron technology nodes P. Daglio, STMicroelectronics Srl., Agrate, Italy
14.15 - 14.45	IMMS - Design and Optimization of a High-Speed Blu-ray Disc Photodetector IC with WiCkeD E. Hennig, IMMS GmbH, Erfurt, Germany
14.45 - 15.15	STMicroelectronics: WiCkeD - Statistical Analysis and Optimization of a Sense Amplifier for very low voltage applications in CMOS 90nm Flash technology from IMS MMS CR&D M. Micciche, A. Di Martino, STMicroelectronics Srl., Smart Card Group, Catania, Italy
15.15 - 15.45	Ulm University for Applied Science: Investigations on Performance and Productivity Improvement of CMOS Circuits for Analog Signal Processing with WiCkeD F. Mrugalla, G. Vallant, G. Forster, University for Applied Science Ulm, Germany
15.45 - 16.15	Coffee & Discussion
16.15 - 17.15	Expert Session: WiCkeD - Tool Demos, Q&A & Feedbacks B. Lemaitre, M. Pronath, MunEDA GmbH, Munich, Germany