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MUGM Europe 2006 Presentations

Analysis and optimization of a sense amplifier in 130 nm technology with WiCkeD
C. Roma, ST Microelectronics

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Reuse of Circuit Topologies using WiCkeD
V. Boos, IMMS gGmbH

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WiCkeD^TM 5.0 - new features & functionalities
M. Pronath, VP Products & Solutions, MunEDA GmbH

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6T for Embedded SRAM - six sigma design with WiCkeD
T. Fischer, Infineon AG

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Yield Optimization of a Power-on Reset Cell and Experimental Verification
O. Eisenberger, austriamicrosystems AG

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Circuit Design-for-Yield (DFY) for a 110 dB Op-Amp for Automotive and Sensor Applications
U. Sobe, ZMD AG
K.-H. Rooch, ZMD AG

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