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Title / Audience Date Time Duration Moderator / Company Speaker / Company
Title:
SRAM - 6sigma yield analysis and optimization with WiCkeD


Audience:
Memory Designers & Design Manager
2011-03-24
2011-03-24
2011-03-24
2011-03-24
2011-03-24
08:00 GMT
09:00 CET
13:30 IST
16:00 CNST
17:00 JST/KST
01:00
Andreas Ripp
MunEDA GmbH

Dr. Michael Pronath
MunEDA GmbH
Description
Many building blocks of SRAM are very sensitive against global variations and mismatch and therefore require powerful analysis and optimization tools to bring the yield and robustness to very high levels like 6 sigma and beyond.
Learning Targets
In this webinar you learn about how to analyse and optimize critical blocks like sense amplifiers for SRAM cells to high yield and robustness levels with MunEDA WiCkeD tools.


Upcoming Webinar (click for more details):
There is no MunEDA Webinar planned for the moment.

Past Webinars (click for more details):
2011-03-24 Title: SRAM - 6sigma yield analysis and optimization with WiCkeD
Audience: Memory Designers & Design Manager
2011-03-22 Title: Increase Efficiency and Quality of I/O Library Design by Circuit Optimization
Audience: I/O & Library Designers and Design Managers
2010-12-07 Title: SRAM - 6sigma yield analysis and optimization with WiCkeD
Audience: Memories Designer & Design Manager
2010-11-09 Title: SRAM - 6sigma yield analysis and optimization with WiCkeD
Audience: Memories Designer & Design Manager
2010-09-23 Title: Increase Efficiency and Quality of I/O Library Design by Circuit Optimization
Audience: I/O & Library Designer and Design Manager in Semiconductor Companies