Design for Manufacturability & Design for Yield
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A. Ripp, MunEDA GmbH, Munich, Germany
Challenges of reliability oriented design strategies for analog and mixed-signal circuits
MEDEA-DAC 2007, May 2007, Grenoble, France
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V. Boos, IMMS GmbH, Erfurt, Germany
Graph Theoretical Approach for Initial Sizing of Analog Circuits
DASS 2007, May 2007, Dresden, Germany
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H. Gräb, Technical University Munich, Germany
Analog Design Centering and Sizing
April 2007, Munich, Germany

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A. Ripp, MunEDA GmbH, Munich, Germany (Chair)
R. Sommer, IMMS - TU Ilmenau
M. Pronath, MunEDA GmbH, Munich, Germany
Design Tutorial DfY-DfM - Design for Yield and Manufacturability
ZuD 2007 - Reliability and Design, March 2007, Munich, Germany
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K.-H. Rooch, U. Sobe, ZMD AG, Dresden, Germany
M. Pronath, MunEDA GmbH, Munich, Germany
Robust Analog Design for Automotive Applications by Design Centering
ZuD 2007 - Reliability and Design, March 2007, Munich, Germany
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