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O. Eisenberger, G. Rappitsch, austriamicrosystems AG, Unterpremstaetten, Austria
B. Obermeier, A. Ripp, M. Pronath, MunEDA GmbH, Munich, Germany
Yield Optimisation of Power-On Reset Cells and Functional Verification
ANALOG06, September 2006, Dresden, Germany
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G. Rappitsch, O. Eisenberger, austriamicrosystems AG, Unterpremstaetten, Austria
B. Obermeier, A. Ripp, M. Pronath, MunEDA GmbH, Munich, Germany
Experimental Verification of Simulation Based Yield Optimization for Power-On Reset Cells
CICC 2006, September 2006, San Jose, CA, USA
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K.-H. Rooch, U. Sobe, ZMD AG, Dresden, Germany
M. Pronath, MunEDA GmbH, Munich, Germany
Circuit Design-for-Yield (DFY) for a 110dB Op-Amp for Automotive and Sensor Applications
ANALOG06, September 2006, Dresden, Germany
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T. Fischer, T. Nirschl, D. Schmitt-Landsiedel, B. Lemaitre, Infineon Technologies, Munich, Germany
Modelling of the parametric yield in decananometer SRAM-Arrays
Advances in Radio Science 2006, September 2006, Katlenburg-Lindau, Germany
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M. Pronath, MunEDA GmbH, Munich, Germany
Design for Yield Concepts for Analogue and Mixed-Signal Circuits
MEDEA-DAC 2006, May 2006, Prien, Germany
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A. Ripp, MunEDA GmbH, Munich, Germany
ANASTASIA+ - Successful bridge from basic methodology research to industrial design tool delivery
MEDEA-DAC 2006, May 2006, Prien, Germany
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A. Ripp, MunEDA GmbH, Munich, Germany (Chair)
M. Bühler, J. Koehl, IBM Deutschland Entwicklung GmbH, Böblingen, Germany
J. Bickford, J. Hibbeler, IBM Inc., Burlington, USA
U. Schlichtmann, Technical University Munich, Germany
R. Sommer, Infineon Technologies AG, Munich, Germany
M. Pronath, A. Ripp, MunEDA GmbH, Munich, Germany
DATE 2006 Special Session: DFM/DFY Design for Manufacturability and Yield - influence of process variations in digital, analog and mixed-signal circuit design
DATE06, March 2006, Munich, Germany
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