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A. Ripp, MunEDA GmbH, Munich, Germany
Robustness and Reliability - Facing new Quality Levels for Automotive ICs with Design for Yield
EuroDesignCon 2005, October 2005, Munich, Germany
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M. Pronath, A. Ripp, MunEDA GmbH, Munich, Germany
Advanced Mathematical and Computational Methods fort he Design Centering of Electronic Circuits
SCEE Summer School 2005, September 2005, Capo D'Orlando, Sicily, Italy
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R. Sommer, Infineon Technologies AG, Munich, Germany
M. Pronath, MunEDA GmbH, Munich, Germany
Seamless Analog/Mixed-Signal Top-Down Design Flow - Applications from Circuit Sizing, Design Centering, and Symbolic Circuit Analysis
MEDEA-DAC 2005, May 2005, Château des Mesnuls, France
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