Design for Manufacturability & Design for Yield
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Tutorials, Customer and Reference Cases

Following, is a list of MunEDA customers and reference cases regarding Design for Manufacturability and Yield projects as well as additional references and detailed application cases. You can also download our Customer Reference Booklet.

Quick reference:
austriamicrosystems | Bosch | Faraday | Fraunhofer | IMMS | Infineon | Melexis | Qimonda | STMicroelectronics | X-Fab | ZFoundry | ZMD | ANASTASIA | HONEY | Sigma65 | Cadence® | Edacentrum | MEDEA | Mentor Graphics | Synopsys | TUM | 65nm | 90nm | 130nm | 180nm | 350nm | 600nm | 800nm
X-Fab - ZMD - MunEDA
ZuE 2008 - Reliability and Design
September 2008, Ingolstadt, Germany
Verification of Safe Operating Area (SOA) Constraints in Analog Circuits
Download Document: PDF
ZMD AG
ZuD 2007 - Reliability and Design
March 2007, Munich, Germany
Robust Analog Design for Automotive Applications by Design Centering
Circuit Reference Case: Fully differential folded cascode OTA in 600nm CMOS Technology
Download Document: PDF
ZMD - ZFoundry

September 2006, Dresden, Germany
ZMD-ZFoundry Circuit Design-for-Yield (DFY) using WiCkeD - 110dB Op-Amp for Automotive and Sensor Applications
Circuit Reference Case: High Gain Operational Transconductance Amplifier in 600nm CMOS Technology
Download Document: PDF
ZMD AG
MUGM Europe 2006
September 2006, Munich, Germany
Automotive Circuit Design for Yield
Circuit Reference Case: 110 dB Operational Amplifier for Automotive and Sensor Applications in 600nm CMOS Technology
Download Document: PDF
ZMD - MunEDA
ANALOG06
September 2006, Dresden, Germany
Circuit Design-for-Yield (DFY) for a 110dB Op-Amp for Automotive and Sensor Application
Download Document: PDF
Find more application cases here or contact us to get more information on real-life customer projects.