Design for Manufacturability & Design for Yield
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Tutorials, Customer and Reference Cases

Following, is a list of MunEDA customers and reference cases regarding Design for Manufacturability and Yield projects as well as additional references and detailed application cases. You can also download our Customer Reference Booklet.

Quick reference:
austriamicrosystems | Bosch | Faraday | Fraunhofer | IMMS | Infineon | Melexis | Qimonda | STMicroelectronics | X-Fab | ZFoundry | ZMD | ANASTASIA | HONEY | Sigma65 | Cadence® | Edacentrum | MEDEA | Mentor Graphics | Synopsys | TUM | 65nm | 90nm | 130nm | 180nm | 350nm | 600nm | 800nm
Infineon - TUM
MUGM Europe 2006
September 2006, Munich, Germany
6T SRAM Six Sigma Design with WiCkeD
Circuit Reference Case: SRAM Memory Cell
Download Document: PDF
Qimonda - TUM
DAC 2006
July 2006, San Francisco, CA, USA
A CPPLL Hierarchical Optimization Methodology Considering Jitter, Power and Locking Time
Circuit Reference Case: Charge Pump - Phased Locked Loop (PLL) in 90nm CMOS Technology
Download Document: [Link]
Infineon - MunEDA - TUM
Ekompass Workshop
May 2004, Hannover, Germany
Systematic Analog/Mixed-Signal Design and Design Accuracy
Circuit Reference Case: FC OpAmp in 130nm CMOS Technology
Download Document: PDF
Find more application cases here or contact us to get more information on real-life customer projects.