Design for Manufacturability & Design for Yield
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Tutorials, Customer and Reference Cases

Following, is a list of MunEDA customers and reference cases regarding Design for Manufacturability and Yield projects as well as additional references and detailed application cases. You can also download our Customer Reference Booklet.

Quick reference:
austriamicrosystems | Bosch | Faraday | Fraunhofer | IMMS | Infineon | Melexis | Qimonda | STMicroelectronics | X-Fab | ZFoundry | ZMD | ANASTASIA | HONEY | Sigma65 | Cadence® | Edacentrum | MEDEA | Mentor Graphics | Synopsys | TUM | 65nm | 90nm | 130nm | 180nm | 350nm | 600nm | 800nm
STMicroelectronics - Infineon - X-Fab - MunEDA - IMMS
EUROPEAN NANOELECTRONICS Forum 2008
November 2008, Paris, France
HONEY – Highly Optimized Design Methods for Yield and Reliability 2A713
Download Document: PDF
STMicroelectronics - Infineon - X-Fab - MunEDA - IMMS
MEDEA+ Annual Forum 2007
November 2007, Budapest, Hungary
HONEY – Highly Optimized Design Methods for Yield and Reliability
Download Document: PDF
Find more application cases here or contact us to get more information on real-life customer projects.