Following, is a list of MunEDA customers and reference cases regarding Design for Manufacturability and Yield projects as well as additional references and detailed
application cases. You can also download our Customer Reference Booklet.
June 2007, Hannover, Germany 65nm Technology Based Modelling and Analysis Methodologies based on Variations Circuit Reference Case: Digital Cell Libraries (SSTA) in 65nm CMOS Technology
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Infineon Technologies MUGM Europe 2006
September 2006, Munich, Germany Modelling of the parametric yield in decananometer SRAM-Arrays Circuit Reference Case: Sense-Amplifier for SRAM-Memory in 90nm and 65nm CMOS Technology
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Find more application cases here or contact us to get more information on real-life customer projects.