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DFM/DFY-Seminars and Tutorials
Together with partners MunEDA offers DFM/DFY seminars and tutorials with presentations about different topics within the Design for Manufacturability and Yield area. The seminar and tutorial offerings cover the following topics:
- Basics of analog circuit sizing
- DFM/DFY - Design for Manufacturability and Yield
- DFM/DFY in the analog/mixe-signal design flow
- Analog circuit sizing using adaptive worst-case parameter sets
- Stratified Sampling / Importance Sampling with Monte-Carlo Methods
- Statistical Methods and Applications for Circuit Sizing
- Re-sizing for Technology Migration of Analog, Mixed-Signal and Digital Cells
- Improving Robustness against Mismatch by Direct Yield Optimization
- Specification-Driven Design of Analog Cells with WiCkeD
- Operational Yield Estimation by Monte-Carlo Analysis and Worst-Case Analysis
- Fast Interactive Sizing of Analog Cells by Nominal Diagnosis and Functional Constraints
- Complex Repeatable Analyses and Design Steps by Scripting in WiCkeD
Please contact us regarding more information or to receive an individual DFM/DFY seminar or tutorial proposal.
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